Zobrazeno 1 - 10
of 12
pro vyhledávání: '"«aluminium – aluminium oxide» system"'
Akademický článek
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Autor:
Alexander P. Ilyin, Andrei V. Mostovshchikov, Liudmila O. Root, Sergey V. Zmanovskiy, Valentina V. Smirnova, Daniyar V. Ismailov, Guzel U. Ruzieva
Publikováno v:
Известия Томского политехнического университета: Инжиниринг георесурсов, Vol 331, Iss 5, Pp 201-207 (2020)
The relevance of the research.One of the leaders in production of aluminum powders in Russia OOO «SUAL-PM» has passed from production of coarse powders to production of micron powders with higher reactivity. Aluminiummicropowders are used in many b
Externí odkaz:
https://doaj.org/article/d13ebb4339ff4a5ab15b25e784535097
Autor:
Ilyin, Aleksandr Petrovich, Mostovshchikov, Andrey Vladimirovich, Root, Lyudmila Olegovna, Zmanovskiy, Sergey Vladislavovich, Smirnova, Valentina Vladimirovna, Ismailov, Daniyar Valerevich, Ruzieva, Guzel Useinovna
Publikováno v:
Известия Томского политехнического университета
Bulletin of the Tomsk Polytechnic University
Bulletin of the Tomsk Polytechnic University
Актуальность исследования. Один из лидеров по производству алюминиевых порошков в России ООО "СУАЛ ПМ" перешел от выпуска грубодисперсн
Autor:
W Swiatkowski, R Ewertowski
Publikováno v:
Physica Scripta. 35:745-746
The angular correlation of annihilation photons (ACAP) for multilayer aluminium-aluminium oxide sandwich had been measured. The ACAP observed for the sandwich plane parallel to the annihilation spectrometer axis appeared to be broader than the one ob
Akademický článek
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Autor:
Grosskreutz, J. C., Shaw, G. G.
Publikováno v:
Philosophical Magazine (00318086); Dec1964, Vol. 10 Issue 108, p961-968, 8p
Publikováno v:
Surface Science. 429:117-126
Surface modification of thin aluminium films is both produced and characterised by exciting surface plasmon polaritons in an attenuated total reflection geometry: silica prism/aluminium/ aluminium oxide system. The modification is performed, under am
Autor:
Perkins, J. G.
The work has been directed towards the investigation of the ion implantation doping effects in thin metal and dielectric films so that knowledge may be gained regarding the feasibility of using ion implantation to produce active and passive thin film
Externí odkaz:
https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.468723
Autor:
Perkins, J G.
The work has been directed towards the investigation of the ion implantation doping effects in thin metal and dielectric films so that knowledge may be gained regarding the feasibility of using ion implantation to produce active and passive thin film
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______305::cc6bfe8cc1c159bbe129c27e2b7107ad
https://surrey.eprints-hosting.org/844639/
https://surrey.eprints-hosting.org/844639/
Autor:
William D. Callister, Jr, David G. Rethwisch, Aaron Blicblau, Kiara Bruggeman, Michael Cortie, John Long, Judy Hart, Ross Marceau, Ryan Mitchell, Reza Parvizi, David Rubin De Celis Leal, Steven Babaniaris, Subrat Das, Thomas Dorin, Ajay Mahato, Julius Orwa
KEY EQUATIONS -- LIST OF SYMBOLS -- KEY TERMS -- QUESTIONS AND PROBLEMS -- REFERENCES -- CHAPTER 4 Imperfections in solids -- 4.1 Introduction -- POINT DEFECTS -- 4.2 Vacancies and self-interstitials -- 4.3 Impurities in solids -- Solid solutions --