Mapping of mechanical strain induced by thin and narrow dielectric stripes on InP surfaces

Autor: Christophe Levallois, Marc Fouchier, Daniel T. Cassidy, Juan Jiménez, A. Torres, Névine Rochat, Jean-Pierre Landesman, Merwan Mokhtari, Erwine Pargon

Publikováno v: Optics Letters
Optics Letters, Optical Society of America-OSA Publishing, 2018, 43 (15), pp.3505. ⟨10.1364/OL.43.003505⟩
Optics Letters, 2018, 43 (15), pp.3505. ⟨10.1364/OL.43.003505⟩
UVaDOC. Repositorio Documental de la Universidad de Valladolid
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International audience; We investigated deformation of InP that was introduced by thin, narrow, dielectric SINx stripes on the (100) surface of InP substrates. Quantitative optical measurements were performed using two different techniques based on l

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https://hal-univ-rennes1.archives-ouvertes.fr/hal-01861356