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Autor:
Carlo De Santi, Luca Sayadi, Enrico Zanoni, Matteo Meneghini, Gerhard Prechtl, Sebastien Sicre, Gaudenzio Meneghesso, Andrea Minetto, Nicola Modolo
Publikováno v:
IEEE Journal of Emerging and Selected Topics in Power Electronics. 10:5019-5026
The goal of this paper is to advance the understanding of the impact of hard switching on the dynamic performance of GaN-based HEMTs. To this aim, we developed a fast (10 V/ns) on-wafer system for testing devices in hard switching. The system has bee