Zobrazeno 51 - 55
of 55
pro vyhledávání: '"Zheng, Fengshan"'
Autor:
Jiang, Jie, Sun, Xin, Chen, Xinchun, Wang, Baiwei, Chen, Zhizhong, Hu, Yang, Guo, Yuwei, Zhang, Lifu, Ma, Yuan, Gao, Lei, Zheng, Fengshan, Jin, Lei, Chen, Min, Ma, Zhiwei, Zhou, Yuanyuan, Padture, Nitin P., Beach, Kory, Terrones, Humberto, Shi, Yunfeng, Gall, Daniel
Publikováno v:
Nature Communications; 10/16/2019, Vol. 10 Issue 1, pN.PAG-N.PAG, 1p
Autor:
Guo, Jun, Zhang, Yi-Xin, Wang, Zi-Yuan, Zheng, Fengshan, Ge, Zhen-Hua, Fu, Jiecai, Feng, Jing
Publikováno v:
Nano Energy; December 2020, Vol. 78 Issue: 1
Autor:
'Zheng, Fengshan
Publikováno v:
Rybakov, Filipp N.
Autor:
Song, Dongsheng, Wang, Lin, Wang, Weiwei, Zheng, Fengshan, Tang, Jin, Wang, Shasha, Zhu, Chao, Caron, Jan, Kovács, András, Liu, Zheng, Mandrus, David, Tian, Mingliang, Du, Haifeng, Dunin-Borkowski, Rafal E.
Publikováno v:
Physical review / B 102(6), 064432 (2020). doi:10.1103/PhysRevB.102.064432
Magnetic soliton crystals with layered structures that host periodic chiral helimagnetic ordering are promising candidates for spintronic nanodevices. Among them, helimagnetic CrNb3S6 is unique owing to its crystallographic chirality and monoaxial Dz
Autor:
Zheng F; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.; Spin-X Institute, Electron Microscopy Center, School of Physics and Optoelectronics, State Key Laboratory of Luminescent Materials and Devices, Guangdong-Hong Kong-Macao Joint Laboratory of Optoelectronic and Magnetic Functional Materials, South China University of Technology, Guangzhou, China., Migunov V; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.; Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany., Caron J; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Du H; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.; Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany., Pozzi G; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.; Department FIM, University of Modena and Reggio Emilia, Modena, Italy., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2023 Jul 22; Vol. 29 (Supplement_1), pp. 1392-1393.