Zobrazeno 11 - 20
of 908
pro vyhledávání: '"Michler, Johann"'
Autor:
Pratama, Killang, Tian, Chunhua, Schürch, Patrik, Casari, Daniele, Watroba, Maria, Koelmans, Wabe W., Michler, Johann, Schwiedrzik, Jakob
Publikováno v:
In Additive Manufacturing 25 May 2024 88
Autor:
Navidi Kashani, Amir Hossein, Hans, Marcus, Lellig, Sebastian, Holzapfel, Damian M., Löfler, Lukas, Mráz, Stanislav, Primetzhofer, Daniel, Michler, Johann, Schneider, Jochen M.
Publikováno v:
In Acta Materialia 15 May 2024 270
Autor:
Tian, Chunhua, Pratama, Killang, Sharma, Amit, Watroba, Maria, Michler, Johann, Schwiedrzik, Jakob
Publikováno v:
In Materials Science & Engineering A April 2024 897
Autor:
Pratama, Killang, Tian, Chunhua, Sharma, Amit, Watroba, Maria, Gubicza, Jenő, Dilasari, Bonita, Schwiedrzik, Jakob, Michler, Johann
Publikováno v:
In Surface & Coatings Technology 30 March 2024 480
Autor:
Bednarczyk, Wiktor, Wątroba, Maria, Cieślak, Grzegorz, Ciemiorek, Marta, Hamułka, Kamila, Schreiner, Claudia, Figi, Renato, Marciszko-Wiąckowska, Marianna, Cios, Grzegorz, Schwiedrzik, Jakob, Michler, Johann, Gao, Nong, Lewandowska, Małgorzata, Langdon, Terence G.
Publikováno v:
In Materials Science & Engineering A February 2024 892
Autor:
Jones, Helen, Tong, Vivian, Ramachandramoorthy, Rajaprakash, Mingard, Ken, Michler, Johann, Gee, Mark
Tungsten carbide cobalt hardmetals are commonly used as cutting tools subject to high operation temperature and pressures, where the mechanical performance of the tungsten carbide phase affects the wear and lifetime of the material. In this study, th
Externí odkaz:
http://arxiv.org/abs/2101.04374
Autor:
Kochetkova, Tatiana, Hanke, Markus S., Indermaur, Michael, Groetsch, Alexander, Remund, Stefan, Neuenschwander, Beat, Michler, Johann, Siebenrock, Klaus A., Zysset, Philippe, Schwiedrzik, Jakob
Publikováno v:
In Bone December 2023 177
High angular resolution electron backscatter diffraction (HR-EBSD) was coupled with focused ion beam (FIB) slicing to characterize the shape of the plastic zone in terms of geometrically necessary dislocations (GNDs) in W single crystal in 3 dimensio
Externí odkaz:
http://arxiv.org/abs/2008.03567
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam (FIB) mill
Externí odkaz:
http://arxiv.org/abs/2003.13294
Autor:
Lauener, Carmen M., Schwarz, Fabian, Pethö, Laszlo, Wheeler, Jeffrey M., Michler, Johann, Spolenak, Ralph
Publikováno v:
In Materials & Design November 2023 235