Zobrazeno 51 - 60
of 62
pro vyhledávání: '"Ievlev AV"'
Autor:
Li C; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; Department of Material Science and Engineering, University of Central Florida , Orlando, Florida 32816, United States., Ding Y; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; Department of Material Science and Engineering, University of Central Florida , Orlando, Florida 32816, United States., Soliman M; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; Department of Material Science and Engineering, University of Central Florida , Orlando, Florida 32816, United States., Lorenzo J; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; CREOL, College of Optics and Photonics, University of Central Florida , Orlando, Florida 32816, United States., Dhasmana N; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; CREOL, College of Optics and Photonics, University of Central Florida , Orlando, Florida 32816, United States., Chantharasupawong P; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; CREOL, College of Optics and Photonics, University of Central Florida , Orlando, Florida 32816, United States., Ievlev AV; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , 1 Bethel Valley Rd., Oak Ridge, Tennessee 37831, United States., Gesquiere AJ; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; Department of Material Science and Engineering, University of Central Florida , Orlando, Florida 32816, United States.; Department of Chemistry, University of Central Florida , Orlando, Florida 32816, United States.; CREOL, College of Optics and Photonics, University of Central Florida , Orlando, Florida 32816, United States., Tetard L; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; Department of Material Science and Engineering, University of Central Florida , Orlando, Florida 32816, United States., Thomas J; NanoScience Technology Center, University of Central Florida , Orlando, Florida 32826, United States .; Department of Material Science and Engineering, University of Central Florida , Orlando, Florida 32816, United States.; CREOL, College of Optics and Photonics, University of Central Florida , Orlando, Florida 32816, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2016 Feb; Vol. 8 (7), pp. 4730-8. Date of Electronic Publication: 2016 Feb 09.
Autor:
Ievlev AV; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Susner MA; Materials Science and Technology Division, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., McGuire MA; Materials Science and Technology Division, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Maksymovych P; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Kalinin SV; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.
Publikováno v:
ACS nano [ACS Nano] 2015 Dec 22; Vol. 9 (12), pp. 12442-50. Date of Electronic Publication: 2015 Nov 09.
Autor:
Ievlev AV; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Jesse S; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Cochell TJ; Department of Chemical and Materials Engineering, University of Kentucky , Lexington, Kentucky 40506, United States., Unocic RR; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Protopopescu VA; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; Computational Sciences & Engineering Division, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Kalinin SV; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , One Bethel Valley Road, Oak Ridge, Tennessee 37831, United States.
Publikováno v:
ACS nano [ACS Nano] 2015 Dec 22; Vol. 9 (12), pp. 11784-91. Date of Electronic Publication: 2015 Nov 02.
Autor:
Ievlev AV; The Institute for Functional Imaging of Materials and The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley rd., Oak Ridge, TN 37831, USA. ievlevav@ornl.gov., Kalinin SV
Publikováno v:
Nanoscale [Nanoscale] 2015 Jul 07; Vol. 7 (25), pp. 11040-7. Date of Electronic Publication: 2015 Jun 05.
Autor:
Ievlev AV; The Center for Nanophase Materials Sciences and ‡Institute for Functional Imaging of Materials, Oak Ridge National Laboratory , 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States., Alikin DO, Morozovska AN, Varenyk OV, Eliseev EA, Kholkin AL, Shur VY, Kalinin SV
Publikováno v:
ACS nano [ACS Nano] 2015 Jan 27; Vol. 9 (1), pp. 769-77. Date of Electronic Publication: 2014 Dec 17.
Autor:
Ievlev AV; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, Tennessee 37831, USA., Morozovska AN; Institute of Physics, National Academy of Sciences of Ukraine, 46, pr. Nauki, 03028 Kiev, Ukraine., Eliseev EA; Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, 3, Krjijanovskogo, 03142 Kiev, Ukraine., Shur VY; Ferroelectric Laboratory, Institute of Natural Sciences, Ural Federal University, 51 Lenin avenue, 620000 Ekaterinburg, Russia., Kalinin SV; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, Tennessee 37831, USA.
Publikováno v:
Nature communications [Nat Commun] 2014 Jul 28; Vol. 5, pp. 4545. Date of Electronic Publication: 2014 Jul 28.
Autor:
Strelcov E; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, 37831, United States., Ievlev AV, Jesse S, Kravchenko II, Shur VY, Kalinin SV
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2014 Feb 12; Vol. 26 (6), pp. 958-63. Date of Electronic Publication: 2013 Nov 26.
Autor:
Shur VY; Institute of Natural Sciences, Ural Federal University, Ekaterinburg, Russian Federation. denis.alikin@labfer.usu.ru, Alikin DO, Ievlev AV, Dolbilov MA, Sarmanova MF, Gavrilov NV
Publikováno v:
IEEE transactions on ultrasonics, ferroelectrics, and frequency control [IEEE Trans Ultrason Ferroelectr Freq Control] 2012 Sep; Vol. 59 (9), pp. 1934-41.
Autor:
Ievlev AV
Publikováno v:
Voenno-meditsinskii zhurnal [Voen Med Zh] 1985 Jul (7), pp. 61-3.
Publikováno v:
Voenno-meditsinskii zhurnal [Voen Med Zh] 1985 Sep (9), pp. 48-50.