Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Yiming Qu"'
Publikováno v:
IEEE Transactions on Electron Devices. 68:1214-1220
The ferroelectric (FE) polarization switching behavior in the HfZrO2 (HZO) FE/dielectric (FE/DE) stack is investigated systematically by charge responses from pulse measurements. The trapped charge density at the FE/DE interface related with the FE p
Publikováno v:
IEEE Transactions on Electron Devices. 67:5315-5321
In this work, the conductance method with an optimized circuit model is established to investigate the trapped charges at the ferroelectric/dielectric (FE/DE) interface. The density of interface states is quantitatively characterized to be $\sim 4 \t
Publikováno v:
2020 IEEE Symposium on VLSI Technology.
In this work, we report on the multi-probe characterization of interfacial charges at the ferroelectric/dielectric (FE/DE) interface in response to both large-signal measurement associated with polarization switching and small-signal measurement with