Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Bang-Ying Yu"'
Autor:
Bang-Ying Yu, Jing-Jong Shyue, Wei-Chun Lin, Shin-ichi Iida, Mao-Feng Hsu, Wei-Ben Wang, Miyako Tozu, Yu-Chin Lin, Jwo-Huei Jou
Publikováno v:
Organic Electronics. 10:459-464
Small molecular organic light-emitting diodes (OLEDs) can be fabricated by spin-coating and thermo-evaporation of organic materials. In this work, X-ray photoelectron spectrometry (XPS) and secondary ion mass spectrometry (SIMS) are used to examine t
Publikováno v:
Applied Surface Science. 255:2490-2493
The damage to the solid by low-energy single atomic projectiles and high-energy cluster ion beams is analyzed by evaluating the Si (0 0 1) surface after ion sputtering, with angle-resolved x-ray photoelectron spectroscopy (ARXPS), high-resolution tra
Autor:
Jing-Jong Shyue, Wei-Ben Wang, Mao-Feng Hsu, Ying-Yu Chen, Bang-Ying Yu, Wei-Chun Lin, Yu-Chin Lin, Jwo-Huei Jou
Publikováno v:
Analytical Chemistry. 80:501-505
A buckminsterfullerene (C(60)) ion beam was used for X-ray photoelectron spectrometry depth profiling of various organic thin films. Specimens representing different interfaces in organic light-emitting diode devices, including hole-conducting poly(e
Autor:
Sun-Zen Chen, Chi-Ping Liu, Jwo-Huei Jou, Bang-Ying Yu, Hsun-Yun Chang, Jing-Jong Shyue, Shin-ichi Iida, Chia-Yi Liu, Guo-Ji Yen, Wei-Ben Wang, Che-Hung Kuo, Szu-Hsian Lee, Chi-Jen Chang, Yun-Wen You, Wei-Chun Lin, Wei-Lun Kao
Publikováno v:
The Analyst. 136(4)
The nanostructure of the light emissive layer (EL) of polymer light emitting diodes (PLEDs) was investigated using force modulation microscopy (FMM) and scanning time-of-flight secondary ion mass spectrometry (ToF-SIMS) excited with focused Bi(3)(2+)
Autor:
Chia-Yi Liu, Bang-Ying Yu, Jing-Jong Shyue, Jwo-Huei Jou, Shin-ichi Iida, Szu-Hsian Lee, Yun-Wen You, Sun-Zen Chen, Wei-Ben Wang, Chi-Ping Liu, Che-Hung Kuo, Wei-Chun Lin, Wei-Lun Kao, Guo-Ji Yen
Publikováno v:
ACS nano. 4(2)
Solution processable fullerene and copolymer bulk heterojunctions are widely used as the active layers of solar cells. In this work, scanning time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used to examine the distribution of [6,6]phenyl
Autor:
Yu-Chin Lin, Mao-Feng Hsu, Chih-Wei Chu, Jing-Jong Shyue, Wei-Ben Wang, Shu-Ping Tsai, Bang-Ying Yu, Wei-Chun Lin, Ying-Yu Chen, Jwo-Huei Jou
Publikováno v:
Analytical chemistry. 80(9)
By sputtering organic films with 10 kV, 10 nA C60+ and 0.2 kV, 300 nA Ar+ ion beams concurrently and analyzing the newly exposed surface with X-ray photoelectron spectroscopy, organic thin-film devices including an organic light-emitting diode and a
Publikováno v:
The Analyst. 134:945
The change of the chemical states of inorganic oxoanion salts by low-energy single atomic projectiles (0.5 kV Ar(+)), high-energy cluster ion beams (10 kV C(60)(+)), and mixed 0.2 kV Ar(+) and 10 kV C(60)(+) are presented. Although the sputtering con