Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Shangwen Wang"'
Autor:
Haoye Tian, Xunzhu Tang, Andrew Habib, Shangwen Wang, Kui Liu, Xin Xia, Jacques Klein, TegawendÉ F. BissyandÉ
Publikováno v:
info:eu-repo/grantAgreement/EC/H2020/949014
In this work, we propose a novel perspective to the problem of patch correctness assessment: a correct patch implements changes that "answer" to a problem posed by buggy behaviour. Concretely, we turn the patch correctness assessment into a Question
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e54a769e0fda14ffced97ac3418be21c
http://orbilu.uni.lu/handle/10993/52135
http://orbilu.uni.lu/handle/10993/52135
Autor:
Steffen Herbold, Alexander Trautsch, Benjamin Ledel, Alireza Aghamohammadi, Taher A. Ghaleb, Kuljit Kaur Chahal, Tim Bossenmaier, Bhaveet Nagaria, Philip Makedonski, Matin Nili Ahmadabadi, Kristof Szabados, Helge Spieker, Matej Madeja, Nathaniel Hoy, Valentina Lenarduzzi, Shangwen Wang, Gema Rodríguez-Pérez, Ricardo Colomo-Palacios, Roberto Verdecchia, Paramvir Singh, Yihao Qin, Debasish Chakroborti, Willard Davis, Vijay Walunj, Hongjun Wu, Diego Marcilio, Omar Alam, Abdullah Aldaeej, Idan Amit, Burak Turhan, Simon Eismann, Anna-Katharina Wickert, Ivano Malavolta, Matúš Sulír, Fatemeh Fard, Austin Z. Henley, Stratos Kourtzanidis, Eray Tuzun, Christoph Treude, Simin Maleki Shamasbi, Ivan Pashchenko, Marvin Wyrich, James Davis, Alexander Serebrenik, Ella Albrecht, Ethem Utku Aktas, Daniel Strüber, Johannes Erbel
Publikováno v:
Emperical Software Engineering, 27, 6, pp. 1-55
Empirical Software Engineering, 27:125, 1-49. Springer Netherlands
Herbold, S, Trautsch, A, Ledel, B, Aghamohammadi, A, Ghaleb, T A, Chahal, K K, Bossenmaier, T, Nagaria, B, Makedonski, P, Ahmadabadi, M N, Szabados, K, Spieker, H, Madeja, M, Hoy, N, Lenarduzzi, V, Wang, S, Rodríguez-Pérez, G, Colomo-Palacios, R, Verdecchia, R, Singh, P, Qin, Y, Chakroborti, D, Davis, W, Walunj, V, Wu, H, Marcilio, D, Alam, O, Aldaeej, A, Amit, I, Turhan, B, Eismann, S, Wickert, A K, Malavolta, I, Sulír, M, Fard, F, Henley, A Z, Kourtzanidis, S, Tuzun, E, Treude, C, Shamasbi, S M, Pashchenko, I, Wyrich, M, Davis, J, Serebrenik, A, Albrecht, E, Aktas, E U, Strüber, D & Erbel, J 2022, ' A fine-grained data set and analysis of tangling in bug fixing commits ', Empirical Software Engineering, vol. 27, 125, pp. 1-49 . https://doi.org/10.1007/s10664-021-10083-5
Empirical Software Engineering, 27(6):125. Springer
Empirical Software Engineering, 27 (6), Art.-Nr.: 125
Emperical Software Engineering, 27, 1-55
Empirical Software Engineering, 27:125, 1-49. Springer Netherlands
Herbold, S, Trautsch, A, Ledel, B, Aghamohammadi, A, Ghaleb, T A, Chahal, K K, Bossenmaier, T, Nagaria, B, Makedonski, P, Ahmadabadi, M N, Szabados, K, Spieker, H, Madeja, M, Hoy, N, Lenarduzzi, V, Wang, S, Rodríguez-Pérez, G, Colomo-Palacios, R, Verdecchia, R, Singh, P, Qin, Y, Chakroborti, D, Davis, W, Walunj, V, Wu, H, Marcilio, D, Alam, O, Aldaeej, A, Amit, I, Turhan, B, Eismann, S, Wickert, A K, Malavolta, I, Sulír, M, Fard, F, Henley, A Z, Kourtzanidis, S, Tuzun, E, Treude, C, Shamasbi, S M, Pashchenko, I, Wyrich, M, Davis, J, Serebrenik, A, Albrecht, E, Aktas, E U, Strüber, D & Erbel, J 2022, ' A fine-grained data set and analysis of tangling in bug fixing commits ', Empirical Software Engineering, vol. 27, 125, pp. 1-49 . https://doi.org/10.1007/s10664-021-10083-5
Empirical Software Engineering, 27(6):125. Springer
Empirical Software Engineering, 27 (6), Art.-Nr.: 125
Emperical Software Engineering, 27, 1-55
Context: Tangled commits are changes to software that address multiple concerns at once. For researchers interested in bugs, tangled commits mean that they actually study not only bugs, but also other concerns irrelevant for the study of bugs. Object
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d689f808bf1a79c62d0194a850a52737
https://repository.ubn.ru.nl/handle/2066/251944
https://repository.ubn.ru.nl/handle/2066/251944
Autor:
Kisub Kim, Tegawendé F. Bissyandé, Yves Le Traon, Xiaoguang Mao, Kui Liu, Anil Koyuncu, Dongsun Kim, Peng Wu, Jacques Klein, Shangwen Wang
Publikováno v:
BASE-Bielefeld Academic Search Engine
ICSE
ICSE
Test-based automated program repair has been a prolific field of research in software engineering in the last decade. Many approaches have indeed been proposed, which leverage test suites as a weak, but affordable, approximation to program specificat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a7a3dca38895880592b8584b70aff603
Publikováno v:
ESEM
Background: Over the years, Automated Program Repair (APR) has attracted much attention from both academia and industry since it can reduce the costs in fixing bugs. However, how to assess the patch correctness remains to be an open challenge. Two wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8063c0f64957891bf4045a9b644d0bd8
http://arxiv.org/abs/1906.03447
http://arxiv.org/abs/1906.03447
Publikováno v:
EASE
Automated program repair (APR) has attracted widespread attention in recent years with substantial techniques being proposed. Meanwhile, a number of benchmarks have been established for evaluating the performances of APR techniques, among which Defec