Zobrazeno 1 - 10
of 48
pro vyhledávání: '"Liang Yao"'
Autor:
Wan-Sheng Su, Hong Shen, Kai-Ming Ho, Ming Lu, Chong Qiao, Yu Jia, Liang-Yao Chen, Yu-Xiang Zheng, Songyou Wang, Cai-Zhuang Wang, Jinjin Wang, Zhiyuan Yu, Rong-Jun Zhang
Publikováno v:
Nanoscale advances. 3(8)
Though photoluminescence (PL) of Si quantum dots (QDs) has been known for decades and both theoretical and experimental studies have been extensive, their luminescence mechanism has not been elaborated. Several models have been proposed to explain th
Autor:
Songyou Wang, Yu-Xiang Zheng, Yao Shan, Liang-Yao Chen, Haotian Zhang, Yao Chen, Huatian Tu, Jing Li, Rong He, Rong-Jun Zhang
Publikováno v:
Applied Sciences
Volume 11
Issue 2
Applied Sciences, Vol 11, Iss 632, p 632 (2021)
Volume 11
Issue 2
Applied Sciences, Vol 11, Iss 632, p 632 (2021)
In this work, a new buffer layer material, a bismuth-indium (Bi-In) alloy, was utilized to improve the quality of large-area, laser-induced periodic ripple structures on silicon. Better-defined ripple structures and larger modification areas were obt
Publikováno v:
Journal of the Optical Society of America B. 37:2906
In this paper, we investigate a new, to the best of our knowledge, type of guided-mode resonance optical filter with polarization-independence at normal incidence and relatively narrow spectral linewidth in the near-infrared regime. The new optical s
Autor:
Liang-Yao Chen, Yan Sun, Xin Chen, Rong-Jun Zhang, Da-Hai Li, Hong-Liang Lu, Yan-Feng Wei, Yue-Jie Shi, Wei Wei, Ning Dai, Hua Zheng
Publikováno v:
Nanoscale Research Letters, Vol 12, Iss 1, Pp 1-9 (2017)
Titanium dioxide (TiO2) ultrathin films with different thicknesses below 20 nm were grown by atomic layer deposition (ALD) on silicon substrates at 300 °C. Spectroscopic ellipsometry (SE) measurements were operated to investigate the effect of thick
Autor:
Zi-Yi Wang, Fan Zhang, Zi-Jie Xu, Xiang Yu, Yu-Xiang Zheng, Haibin Zhao, Songyou Wang, Liang-Yao Chen, Dong-Xu Zhang, Rong-Jun Zhang
Publikováno v:
Applied Physics A. 113:557-562
TiO2 thin films of different thickness were prepared by the Electron Beam Evaporation (EBE) method on crystal silicon. A variable angle spectroscopic ellipsometer (VASE) was used to determine the optical constants and thickness of the investigated fi
Autor:
Kang-Ning Wu, Liang-Yao Chen, Rong-Jun Zhang, Qing-Yuan Cai, Wei Lin, Hai-Bin Zhao, Dong-Xu Zhang, Yu-Xiang Zheng, Peng-Hui Mao
Publikováno v:
Applied Physics A. 108:975-979
An effective method for determining the optical constants of Ta2O5 thin films deposited on crystal silicon (c-Si) using spectroscopic ellipsometry (SE) measurement with a two-film model (ambient–oxide–interlayer–substrate) was presented. Ta2O5
Autor:
Y. R. Guo, Congjun Wang, F. Dong, Yu-Xiang Zheng, B. Shen, Zishan Wang, Songyou Wang, Ruoxin Zhang, Liang-Yao Chen, Kai-Ming Ho
Publikováno v:
The journal of physical chemistry. B. 119(47)
A first-order phase transition from a high-density liquid to a low-density liquid has been proposed to explain the various thermodynamic anomies of water. It also has been proposed that such liquid-liquid phase transition would exist in supercooled s
Publikováno v:
Applied Physics A. 102:477-483
Crystalline ZnSe nano-needles have been grown by pulsed laser deposition on Ni-coated substrates. In order to study the mechanism for the growth of ZnSe nano-needles, the experiment conditions including catalyst layer, substrate material, substrate t
Publikováno v:
Journal of the Korean Physical Society. 56:1311-1314
Autor:
Hong-Liang Lu, Ji-Ping Xu, Xin Chen, Liang-Yao Chen, Yun Zhang, Yu-Xiang Zheng, Zi-Yi Wang, Yan Sun, Rong-Jun Zhang, Songyou Wang, Yan-Feng Wei
Publikováno v:
Nanoscale Research Letters
The aluminum oxide (Al2O3) thin films with various thicknesses under 50 nm were deposited by atomic layer deposition (ALD) on silicon substrate. The surface topography investigated by atomic force microscopy (AFM) revealed that the samples were smoot