Zobrazeno 1 - 10
of 121
pro vyhledávání: '"Liang Yao"'
Autor:
Yao Chen, Huatian Tu, Jing Li, Haotian Zhang, Yao Shan, YoungPak Lee, Yu-Xiang Zheng, Liang-Yao Chen, Pian Liu, Songyou Wang, Rong-Jun Zhang, Haibin Zhao, Hongzhu Yu
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 70:1-8
We constructed and investigated a high-speed broadband spectroscopic ellipsometric system with 12 polarization channels and a 2-D charge-coupled device. The system without any mechanically moving component completes the measurements of more than 10 0
Autor:
YoungPak Lee, Songyou Wang, W. D. Lynch, An Qing Jiang, Hua Tian Tu, Xiao Dong Xiang, Yu-Xiang Zheng, Jian Ke Chen, Hao Qi Tang, Yue Mei Yang, Junpeng Guo, Rong Jun Zhang, Osamu Yoshie, Hai Bin Zhao, Jing Li, Wei Jie Lu, Kai Yan Zang, Liang Yao Chen
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-9 (2021)
Scientific Reports
Scientific Reports
Unlike the single grating Czerny–Turner configuration spectrometers, a super-high spectral resolution optical spectrometer with zero coma aberration is first experimentally demonstrated by using a compound integrated diffraction grating module cons
Publikováno v:
Journal of Electromagnetic Waves and Applications. 34:2251-2265
In recent years, the exotic capability of metamaterials to absorb perfectly electromagnetic wave has induced potentially many practical purposes, especially, the rapid growth of 5G/6G telecommunica...
Autor:
J. S. Hwang, YoungPak Lee, Bui Son Tung, Min Gi Choi, Young Ju Kim, Bui Xuan Khuyen, Liang-Yao Chen
Publikováno v:
Current Applied Physics. 19:1217-1221
We propose a double-sided metamaterial perfect absorber (MPA) at microwave frequencies, showing absorption of 96.8% at 8.45 GHz. By employing identical front metal-patterned layer for the backside of MPA, it presents the same performance for the inci
Autor:
Huatian Tu, Songyou Wang, Yao Shan, YoungPak Lee, Yao Chen, Rong-Jun Zhang, Liang-Yao Chen, Yu-Xiang Zheng, Haotian Zhang
Publikováno v:
Applied optics. 60(6)
We propose an accurate and rapid azimuth calibration method for polarizing elements in ellipsometry. Over 200 calibrations were achieved simultaneously at different wavelength points in a spectral range of 550–650 nm without any calibrated element.
Autor:
Songyou Wang, Jing Li, Huatian Tu, Haotian Zhang, Rong-Jun Zhang, Yao Shan, Liang-Yao Chen, Yao Chen, Yu-Xiang Zheng, YoungPak Lee
Publikováno v:
Crystals, Vol 11, Iss 349, p 349 (2021)
Crystals
Volume 11
Issue 4
Pages: 349
Crystals
Volume 11
Issue 4
Pages: 349
We proposed a method to study the effects of azimuth and the incident angle on the accuracy and stability of rotating polarizer analyzer ellipsometer (RPAE) with bulk Au. The dielectric function was obtained at various incident angles in a range of 5
Publikováno v:
Optics express. 28(22)
In this work, we investigate a gold nanoslits array optical transmission filter with dual dielectric cap layers on top of the metal nanoslits. By integrating a low index of refraction dielectric layer between a high index of refraction dielectric cap
Autor:
Qu, Yang, wu, Jiayang, yang, Yunyi, Zhang, Yuning, Liang, Yao, Siancalepore, Corrado, Grillet, Christian, Monat, Christele, Jia, Baohua, Moss, David J.
Layered 2D graphene oxide (GO) films are integrated with silicon nitride (SiN) waveguides to experimentally demonstrate an enhanced Kerr nonlinearity via four-wave mixing (FWM). Owing to the strong light–matter interaction between the SiN waveguide
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=sharePrprorg::74b17159574c4cff27a66cfbc0dc1524
Autor:
Liang-Yao Chen, Songyou Wang, David W. Lynch, Shang-Dong Yang, Rong-Jun Zhang, Kai-Yan Zang, Liao Yang, Haibin Zhao, Zhun-Hua Liu, YoungPak Lee, Yu-Xiang Zheng
Publikováno v:
Optical Materials. 73:247-251
Light transmission at the Au/air interface was measured for wedge-shaped Au film samples. Light refraction continuously changing its sign from positive to negative at the Au/air interface in the spectrum range of 470–700 nm was observed with a zero
Autor:
Shang-Dong Yang, Rong-Jun Zhang, Wen-Jie Zhou, Zhun-Hua Liu, Yu-Xiang Zheng, Songyou Wang, Liao Yang, Liang-Yao Chen
Publikováno v:
Applied Surface Science. 421:891-898
Zinc oxide (ZnO) films with thicknesses from (9.1 ± 0.7) to (145 ± 7) nm were deposited on silicon substrates by ion-assisted electron beam evaporation (EBE), and transformed to a highly (110)-oriented non-polar phase through thermal treatment at t