Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Jan Steinbrener"'
Autor:
Jan Steinbrener, Jaka Pribosek, Katja Harms, A. Kenda, Andreas Tortschanoff, Marcus Baumgart, Tibor Bereczki
Publikováno v:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVI.
In light-field microscopy, a single point emitter gives rise to a complex diffraction pattern, which varies with the position of the emitter in object space. In order to use deconvolution-based wave-optical reconstruction schemes for light-field imag
Publikováno v:
Physics Letters A. 377:1150-1153
Coherent soft X-ray diffraction has been used to image nanoporous glass structure in two dimensions using different methods. The merit of the reconstructions was judged using a new method of Fourier phase correlation with a final, refined image. The
Autor:
Ilme Schlichting, Stefan Kassemeyer, Andrew V. Martin, Aliakbar Jafarpour, Jan Steinbrener, Lukas Lomb
Publikováno v:
Physical Review E
Coherent diffractive imaging with x-ray free-electron lasers (XFEL) promises high-resolution structure determination of noncrystalline objects. Randomly oriented particles are exposed to XFEL pulses for acquisition of two-dimensional (2D) diffraction
Autor:
D. Starodub, Lars Gumprecht, Karol Nass, Daniel Rolles, Artem Rudenko, W. Henry Benner, Stefan P. Hau-Riege, Andrew Aquila, Raymond G. Sierra, Herbert J. Tobias, Heinz Graafsma, Joachim Schulz, N. Duane Loh, Matthias Frank, Mengning Liang, Mark S. Hunter, Christina Y. Hampton, Benedikt Rudek, Filipe R. N. C. Maia, Nicola Coppola, Philip H. Bucksbaum, Miriam Barthelmess, Anton Barty, Holger Fleckenstein, Joachim Ullrich, Heike Soltau, Robert L. Shoeman, Henry N. Chapman, Michael J. Bogan, Nils Kimmel, Georg Weidenspointner, Sascha W. Epp, Christian Reich, Tomas Ekeberg, Ilme Schlichting, Thomas A. White, Jan Steinbrener, Peter Holl, Robert Hartmann, Andrew V. Martin, Andreas Hartmann, Christoph Bostedt, John D. Bozek, Max F. Hantke, Stephan Kassemeyer, Helmut Hirsemann, Saša Bajt, Emanuele Pedersoli, Lutz Foucar, Lothar Strueder, Cornelia B. Wunderer, Guenter Hauser, George R. Farquar, Benjamin Erk, Lukas Lomb, Stefano Marchesini
Publikováno v:
Optics express 21(10), 12385 (2013). doi:10.1364/OE.21.012385
Optics Express
Optics Express
Characterizing intense, focused x-ray free electron laser (FEL) pulses is crucial for their use in diffractive imaging. We describe how the distribution of average phase tilts and intensities on hard x-ray pulses with peak intensities of 10(21) W/m(2
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5a8491045b5195883376c7eff829840a
https://bib-pubdb1.desy.de/record/155149
https://bib-pubdb1.desy.de/record/155149
Autor:
Stefan P. Hau-Riege, Hyung Joo Park, N. Duane Loh, Mengning Liang, Mark S. Hunter, Nils Kimmel, Raymond G. Sierra, Joachim Ullrich, W. Henry Benner, John D. Bozek, Artem Rudenko, Christoph Bostedt, Helmut Hirsemann, Stephan Kassemeyer, Andrew Aquila, Herbert J. Tobias, Holger Fleckenstein, Lothar Strueder, Heike Soltau, Nicola Coppola, Christina Y. Hampton, Henry N. Chapman, Michael J. Bogan, Filipe R. N. C. Maia, Daniel Rolles, D. Starodub, Anton Barty, Karol Nass, Georg Weidenspointner, Lars Gumprecht, Lutz Foucar, Jan Steinbrener, Robert L. Shoeman, Heinz Graafsma, Sascha W. Epp, Tomas Ekeberg, Peter Holl, Andreas Hartmann, Robert Hartmann, Philip H. Bucksbaum, Miriam Barthelmess, Matthias Frank, Guenter Hauser, Joachim Schulz, Benedikt Rudek, Lukas Lomb, Stefano Marchesini, Benjamin Erk, Saša Bajt, Emanuele Pedersoli, Max F. Hantke, Christian Reich, Veit Elser, Ilme Schlichting, George R. Farquar, Cornelia B. Wunderer, Andrew V. Martin
Publikováno v:
Optics Express
Optics express 21(23), 28729 (2013). doi:10.1364/OE.21.028729
Optics express 21(23), 28729 (2013). doi:10.1364/OE.21.028729
Optics express 21(23), 28729(2013). doi:10.1364/OE.21.028729
Single shot diffraction imaging experiments via X-ray free- electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the
Single shot diffraction imaging experiments via X-ray free- electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the
Autor:
John C. H. Spence, Stephan Stern, Miriam Barthelmess, Mengning Liang, Christian Reich, Lars Gumprecht, Nils Kimmel, R. B. Doak, Joachim Schulz, John D. Bozek, Benedikt Rudek, N. D. Loh, Robert L. Shoeman, Joachim Ullrich, Christoph Bostedt, Raymond G. Sierra, Matthias Frank, Ilme Schlichting, Sascha W. Epp, Artem Rudenko, Andrew V. Martin, Nicola Coppola, Anton Barty, Karol Nass, Georg Weidenspointner, Christina Y. Hampton, Lukas Lomb, Daniel Rolles, Andrew Aquila, Saša Bajt, Francesco Stellato, Dmitri Starodub, Henry N. Chapman, Benjamin Erk, Michael J. Bogan, Raimo Hartmann, Jan Steinbrener, Andreas Hartmann, Stephan Kassemeyer, Peter Holl, Lutz Foucar, Hartawan Laksmono, Lothar Strüder, Heike Soltau
Publikováno v:
Nature Communications 3, 1276 (2012). doi:10.1038/ncomms2288
Nature Communications
Nature Communications
Diffractive imaging with free-electron lasers allows structure determination from ensembles of weakly scattering identical nanoparticles. The ultra-short, ultra-bright X-ray pulses provide snapshots of the randomly oriented particles frozen in time,
Autor:
Raymond G. Sierra, Ilme Schlichting, Mengning Liang, Henry N. Chapman, Lutz Foucar, Anton Barty, Andrew V. Martin, Günther Hauser, Thomas A. White, W. Henry Benner, George R. Farquar, Lars Gumprecht, Stefan P. Hau-Riege, Michael J. Bogan, Emanuele Pedersoli, Christoph Bostedt, Holger Fleckenstein, Nils Kimmel, Karol Nass, Jan Steinbrener, Tomas Ekeberg, Andreas Hartmann, Georg Weidenspointner, Herbert J. Tobias, Christian Reich, Daniel Rolles, Nicola Coppola, John D. Bozek, Stefano Marchesini, Joachim Ullrich, Stephan Kassemeyer, N. D. Loh, Cornelia B. Wunderer, Lothar Strueder, Mark S. Hunter, Max F. Hantke, Dmitri Starodub, Keith O. Hodgson, Heinz Graafsman, Heike Soltau, Joachim Schulz, Saša Bajt, Peter Holl, Benedikt Rudek, Robert Hartmann, Philip H. Bucksbaum, Miriam Barthelmess, M. Frank, Artem Rudenko, Lukas Lomb, Andrew Aquila, Benjamin Erk, Helmut Hirsemann, Robert L. Shoeman, Sascha W. Epp, Filipe R. N. C. Maia, Christina Y. Hampton
Publikováno v:
Proceedings of SPIE
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer t
Autor:
Emanuele Pedersoli, Chantal Abergel, Nicola Coppola, Joachim Schulz, Cornelia B. Wunderer, Benedikt Rudek, Helmut Hirsemann, Joachim Ullrich, Daniel Rolles, Robert L. Shoeman, Maya Kiskinova, Raymond G. Sierra, Artem Rudenko, Thomas A. White, Günter Hauser, Sascha W. Epp, H. Fleckenstein, Karol Nass, Andrew Aquila, M.M. Seibert, Jakob Andreasson, Lars Gumprecht, Henry N. Chapman, Jean-Michel Claverie, Lukas Lomb, Virginie Seltzer, Andrew V. Martin, Heike Soltau, Lutz Foucar, Gunter Stier, Andreas Hartmann, Daniel P. DePonte, Christina Y. Hampton, Christoph Bostedt, Lothar Strüder, Saša Bajt, Mengning Liang, Christian Reich, Benjamin Erk, Elisabeth Hartmann, Peter Holl, Anton Barty, Robert Hartmann, N. D. Loh, Tomas Ekeberg, Abbas Ourmazd, Janos Hajdu, Peter Schwander, Georg Weidenspointner, Nils Kimmel, John D. Bozek, Stephan Kassemeyer, Jan Steinbrener, Ilme Schlichting, Michael J. Bogan, Inger Andersson, Filipe R. N. C. Maia, Chun Hong Yoon, Dmitri Starodub, Martin Svenda, Miriam Barthelmess, Heinz Graafsma
Publikováno v:
Optics Express
ResearcherID
Optics express 19, 16542-16549 (2011). doi:10.1364/OE.19.016542
ResearcherID
Optics express 19, 16542-16549 (2011). doi:10.1364/OE.19.016542
Single-particle experiments using X-ray Free Electron Lasers produce more than 10(5) snapshots per hour, consisting of an admixture of blank shots (no particle intercepted), and exposures of one or more particles. Experimental data sets also often co
Autor:
Miriam Barthelmess, Elisabeth Hartmann, Stephan P. Hau-Riege, D. Starodub, Dučko Odíc, M. Marvin Seibert, Peter Holl, George R. Farquar, Anton Barty, Emanuele Pedersoli, Raymond G. Sierra, Robert Hartmann, Daniel Rolles, Maya Kiskinova, Janos Hajdu, Karol Nass, Lukas Lomb, Carl Caleman, W. Henry Benner, Georg Weidenspointner, Christina Y. Hampton, Christoph Bostedt, Garth J. Williams, Faton Krasniqi, Carlo Schmidt, Benedikt Rudek, Stefano Marchesini, Heike Soltau, André Hoemke, Artem Rudenko, Andrew V. Martin, Lutz Foucar, Holger Fleckenstein, Thomas A. White, Günther Hauser, Benjamin Erk, Andrew Aquila, N. D. Loh, Phillip Bucksbaum, Nicola Coppola, Tomas Ekeberg, Jacek Krzywinski, Robert L. Shoeman, Filipe R. N. C. Maia, Joachim Schultz, Sascha W. Epp, Lothar Strüder, Lars Gumprecht, Thomas R. M. Barends, Mengning Liang, Christian Reich, Max F. Hantke, Nils Kimmel, Saša Bajt, Jakob Andreasson, Martin Svenda, Francesco Stellato, Matthias Frank, Olof Jönsson, John D. Bozek, Marc Messerschmidt, Henry N. Chapman, Herbert J. Tobias, Jan Steinbrener, Ilme Schlichting, Michael J. Bogan, Stephan Kassemeyer, Daniel Westphal, Joachim Ullrich, Andreas Hartmann, Daniel P. DePonte
Publikováno v:
Proceedings of SPIE
Results of coherent diffractive imaging experiments performed with soft X-rays (1-2 keV) at the Linac Coherent Light Source are presented. Both organic and inorganic nano-sized objects were injected into the XFEL beam as an aerosol focused with an ae
Autor:
Janos Kirz, H. Miao, Andrew Stewart, Stefano Marchesini, Xiaojing Huang, Johanna Nelson, Chris Jacobsen, Joshua J. Turner, E. Lima, David A. Shapiro, Aaron M. Neiman, Jan Steinbrener
We report the first image of an intact, frozen hydrated eukaryotic cell using x-ray diffraction microscopy, or coherent x-ray diffraction imaging. By plunge freezing the specimen in liquid ethane and maintaining it below -170 degrees C, artifacts due
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a6f6629b5194be55adf4aed62b363aec
https://europepmc.org/articles/PMC2866741/
https://europepmc.org/articles/PMC2866741/