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Publikováno v:
Microelectronics Reliability. 51:1464-1468
Reliability prediction of semiconductor devices gains importance, since demand increases and resources, e.g. time, are restricted. Normally, methods focusing on technology aspects are applied. This work presents a more mathematical approach by using
Autor:
J. Gladitz, Jürgen Pilz
Publikováno v:
Series Statistics. 13:371-385
We consider the problem of optimal experimental design in random coefficient regression models with respect to a quadratic loss function. By application of WHITTLE'S general equivalence theorem we obtain the structure of optimal designs. An alogrithm