Zobrazeno 1 - 10
of 51
pro vyhledávání: '"Anjam, A."'
Autor:
Anjam Khursheed, Marco Finazzi, Francesco Rusconi, Monica Bollani, Erfan Mafakheri, Chiara Barri, Nicoletta Granchi, Maria Antonietta Vincenti, Attilio Zilli, Luca Fagiani, P. Biagioni, Marco Abbarchi, Mohammed Bouabdellaoui, Michele Celebrano, Michele Montanari, Francesca Intonti
Publikováno v:
Optical Materials: X, Vol 13, Iss, Pp 100116-(2022)
Optical Materials: X
Optical Materials: X
We propose to exploit the natural mechanical instability of thin solid films to form regular patterns of mono- crystalline atomically smooth silicon and germanium nanostructures that cannot be realized with conventional methods. The solid-state dewet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b9fb235b27c03fb4464bc165c25642d4
https://zenodo.org/record/7573311
https://zenodo.org/record/7573311
Publikováno v:
Optical Materials: X, Vol 12, Iss, Pp 100121-(2021)
This paper presents experimental results to show how secondary electron (SE) energy spectroscopy inside a scanning electron microscope (SEM) might become a useful tool for characterising optical materials. It demonstrates how SE energy spectroscopy c
Publikováno v:
Scientific Reports
Scientific Reports, Vol 11, Iss 1, Pp 1-2 (2021)
Scientific Reports, Vol 11, Iss 1, Pp 1-2 (2021)
This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number and acquire bulk valence band density of states (DOS) information at low primary b
Autor:
Anjam Khursheed, Sarfraz Qureshi, Jeroen A. van Kan, P. Santhana Raman, Rudy Pang, Nannan Liu, Xinxin Xu
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 404:243-249
In order to realize sub-10 nm feature size by proton beam writing (PBW) with writing speed comparable to electron beam lithography (EBL), a 200 kV compact PBW system is proposed here. In this system, a new nano-aperture electron impact ion source wit
Autor:
Anjam Khursheed, Jeroen A. van Kan, Xinxin Xu, P. Santhana Raman, Rajasekaran Mariappan, Rudy Pang
Publikováno v:
Microelectronic Engineering. 174:20-23
Nano-aperture ion source (NAIS) is a potential candidate to be a part of a sub-10nm proton beam writing (PBW) system. To improve the performance of our prototype NAIS, currently we have modified the fabrication process. Through integrating the ioniza
Publikováno v:
Carbon. 110:378-383
For focused electron beam applications, the combination of high spatial resolution with high beam current is frequently required and a ring-cathode source is one novel way of achieving this. In this study, initial experimental results from a Graphene
Autor:
Anjam Khursheed, Wei Kean Ang
Publikováno v:
Microscopy and Microanalysis. 22:948-954
This paper presents a proposal for reducing the final probe size of focused electron/ion beam columns that are operated in a high primary beam current mode where relatively large final apertures are used, typically required in applications such as el
Publikováno v:
Scientific Reports, Vol 9, Iss 1, Pp 1-12 (2019)
Scientific Reports
Scientific Reports
We demonstrate that carbon incorporated Zinc Oxide (C-ZnO) nanowires (NWs) exhibit remarkable improvement in the extent and quality of fluorescence emission after they are utilized as an electron source in a field emission experiment. After the passa
Publikováno v:
Materials Today Advances, Vol 2, Iss, Pp-(2019)
Despite decades of research, the technique of measuring dopant concentration by the scanning electron microscope (SEM) has so far been limited to probing idealized test pn junction specimens, where only step dopant concentrations have been quantified
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 24(5)
This paper presents a new method for creating and monitoring controlled localized negatively charged regions inside insulators with a scanning electron microscope (SEM). A localized buried charged region is created and observed close to the point whe