Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Yuan, Tingting"'
Autor:
Liu, Xinyu, Zhang, Sheng, Wei, Ke, Zhang, Yichuan, Yin, Haibo, Chen, Xiaojuan, Huang, Sen, Liu, Guoguo, Zheng, Yingkui, Yuan, Tingting, Niu, Jiebin, Wang, Xinhua
Publikováno v:
IEEE Electron Device Letters; Sep2022, Vol. 43 Issue 9, p1408-1411, 4p
Autor:
Zhang, Sheng, Wei, Ke, Zhang, Yichuan, Chen, Xiaojuan, Huang, Sen, Liu, Guoguo, Zheng, Yingkui, Yuan, Tingting, Wang, Xinhua, Li, Yankui, Niu, Jiebin, Liu, Xinyu
Publikováno v:
IEEE Electron Device Letters; Oct2021, Vol. 42 Issue 10, p1436-1439, 4p
Autor:
Zhang, Sheng, Liu, Xinyu, Wei, Ke, Huang, Sen, Chen, Xiaojuan, Zhang, Yichuan, Zheng, Yingkui, Liu, Guoguo, Yuan, Tingting, Wang, Xinhua, Yin, Haibo, Yao, Yao, Niu, Jiebin
Publikováno v:
IEEE Transactions on Electron Devices; Jan2021, Vol. 68 Issue 1, p49-52, 4p
Autor:
Wang, Xinhua, Huang, Sen, Zheng, Yingkui, Wei, Ke, Chen, Xiaojuan, Liu, Guoguo, Yuan, Tingting, Luo, Weijun, Pang, Lei, Jiang, Haojie, Li, Junfeng, Zhao, Chao, Zhang, Haoxiang, Liu, Xinyu
Publikováno v:
IEEE Electron Device Letters; Jul2015, Vol. 36 Issue 7, p666-668, 3p
Autor:
Wang, Xinhua, Pang, Lei, Wang, Jianhui, Yuan, Tingting, Luo, Weijun, Chen, Xiaojuan, Liu, Xinyu
Publikováno v:
2012 IEEE International Integrated Reliability Workshop Final Report; 1/ 1/2012, p122-124, 3p