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pro vyhledávání: '"Thomas Coleman"'
Autor:
Thomas Coleman, Chelsea McDonald, John J. Moore, Arn Adams, Fred Nicol, Steve McHugh, Gabriel A. Amparan
Publikováno v:
Advanced Optics for Imaging Applications: UV through LWIR IV.
This paper describes design features that are being implemented in a purpose-built IR camera system to support the study of the solar corona during the 2019 Chile total eclipse. This mission is challenged by the relatively low, inband flux signal con
Publikováno v:
Infrared Technology and Applications XLV.
Designing custom hardware for space payloads often imposes many constraints in terms of non-recurring design effort and material lead times. Transitioning the use of Commercial-Off-The-Shelf (COTS) hardware for increased-severity environmental servic
Publikováno v:
2018 IEEE International Conference on Probabilistic Methods Applied to Power Systems (PMAPS).
This paper analyzes the impacts to system flexibility and reliability risks resulting from ramping uncertainties associated with variable energy resources (VERs) such as wind and solar power. A detailed assessment using statistical analysis and forec
Publikováno v:
2017 IEEE Power & Energy Society General Meeting.
This paper presents a study case of the impact of Variable Energy Resources (VERs) on the Reserve Margin of the ERCOT region. Wind and solar are projected to provide a large contribution in generation capacity for the North American Bulk Power System
Autor:
Mahmoud Farhadiroushan, Michael Mondanos, Thomas Coleman, Jackson Yeo, Thomas E. Parker, Craig Milne
Publikováno v:
Sensors for Extreme Harsh Environments II.
Advances in opto-electronics and associated signal processing have enabled the development of Distributed Acoustic and Temperature Sensors. Unlike systems relying on discrete optical sensors a distributed system does not rely upon manufactured sensor
Autor:
Sergey Latinsky, Maik Enger, Thomas Coleman, Reuven Falah, Frank Ludewig, Thomas Marschner, Ofer Lindman
Publikováno v:
SPIE Proceedings.
This paper describes a method to automatically distinguish between line and space for 1:1 line space patterns in mask metrology. As the number of measurements typically performed on a reticle is significantly higher than on a wafer, automated CAD bas