Zobrazeno 1 - 10
of 76
pro vyhledávání: '"Lee, Seong"'
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Yufei Han, Tieniu Tan, Zhenan Sun
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1184-1193, 10p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Kang, Pilsung, Seong-seob Hwang, Sungzoon Cho
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1203-1211, 9p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Roli, Fabio, Didaci, Luca, Marcialis, Gian Luca
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1194-1202, 9p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Freire, Manuel R., Fierrez, Julian, Galbally, Javier
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1134-1143, 10p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Rowe, Robert K.
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1144-1153, 10p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Ben Aloui, Nidhal, Glotin, Hervé, Hebrard, Patrick
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1154-1163, 10p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Zhang, David, Zhi Liu, Jing-qi Yan
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1174-1183, 10p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Kryszczuk, Krzysztof, Drygajlo, Andrzej
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1124-1133, 10p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Das, Amitava
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1114-1123, 10p
Autor:
Hutchison, David, Kanade, Takeo, Kittler, Josef, Kleinberg, Jon M., Mattern, Friedemann, Mitchell, John C., Naor, Moni, Nierstrasz, Oscar, Pandu Rangan, C., Steffen, Bernhard, Sudan, Madhu, Terzopoulos, Demetri, Tygar, Doug, Vardi, Moshe Y., Weikum, Gerhard, Lee, Seong-Whan, Li, Stan Z., Pascual-Gaspar, J. M., Cardeñoso-Payo, V.
Publikováno v:
Advances in Biometrics (9783540745488); 2007, p1057-1066, 10p