Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Koichiro, Morita"'
Publikováno v:
Japanese Journal of Applied Physics. 57:11UC03
Accurate lifetime prediction for multilayer ceramic capacitors (MLCCs) is essential to ensure the reliability of electronic systems. A prediction formula based on a physical model has been recently proposed as an alternative to the widely used empiri
Publikováno v:
Key Engineering Materials. 445:35-38
The lifetime determination model for multilayer ceramic capacitors (MLCCs) is discussed. The accumulation of oxygen vacancies on the cathode/ceramics interface by an electro-migration process is a concept accepted by many researchers. However, the li
Publikováno v:
Ferroelectrics. 356:78-84
To avoid the influence of spontaneous polarization, thermally stimulated current (TSC) measurements of BaTiO3-based multilayer ceramic capacitors with Ni internal electrodes were performed within the paraelectric phase. We observed two TSC peaks and
Autor:
Hirokazu Chazono, Wei En Liu, Youichi Mizuno, Clive A. Randall, G. Y. Yang, Hiroshi Kishi, Elizabeth C. Dickey, Koichiro Morita
Publikováno v:
Japanese Journal of Applied Physics. 46:2984-2990
The electric conduction mechanism for multilayer ceramic capacitors with Ni internal electrodes (Ni-MLCCs) was investigated, utilizing impedance spectroscopy (IS) and thermally stimulated current (TSC) measurement techniques. A modified 4RC equivalen
Publikováno v:
Japanese Journal of Applied Physics. 41:6957-6961
The effect of Mn addition on the microstructure and electrical properties, especially on the dc-electrical degradation, of the X7R-type multilayer ceramic capacitor with Ni internal electrode (Ni-MLCC) with thin active layers was investigated. As the
Publikováno v:
2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics.
The lifetime of multilayer ceramic capacitors (MLCCs) under a high dc electric field (200 kV/cm) was investigated. Mean time to failure (MTTF) during a highly accelerated lifetime test (HALT) was dependent on thickness of dielectric layers, despite t
Autor:
Youichi Mizuno, T. Oguni, Keisuke Kobayashi, Clive A. Randall, N. Inoue, Koichiro Morita, Weiguo Qu, Russell A. Maier
Publikováno v:
Journal of Applied Physics. 113:014101
This paper attempts to improve upon the range of applicability and predictability of the empirical highly accelerated lifetime testing (HALT) equation that has been traditionally used to estimate time dependent breakdown strength performance in multi