Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jürgen Pilz"'
Publikováno v:
Springer Proceedings in Mathematics & Statistics ISBN: 9783319760346
Recent years have witnessed the development of powerful numerical methods to emulate realistic physical systems and their integration into the industrial product development process. Today, finite element simulations have become a standard tool to he
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dcbc7c22d91143bbe84a994f87a541fa
https://doi.org/10.1007/978-3-319-76035-3_11
https://doi.org/10.1007/978-3-319-76035-3_11
Publikováno v:
Quality and Reliability Engineering International. 30:363-373
In semiconductor manufacturing, it is a key to ensure reliability of the produced devices. The population's reliability level is demonstrated by means of a burn-in study (that is investigating a large number of devices under real-life stress conditio
Publikováno v:
Journal of Applied Statistics. 38:1801-1817
In this paper, we study a new Bayesian approach for the analysis of linearly mixed structures. In particular, we consider the case of hyperspectral images, which have to be decomposed into a collection of distinct spectra, called endmembers, and a se
Publikováno v:
Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME).
In this paper Bayesian networks are used to model semiconductor lifetime data from a cyclic stress test system. The data of interest is a mixture of log-normal distributions, representing different failure mechanisms and moreover, the data is censore