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Autor:
Paschel, S., Balasa, I., Jensen, L.O., Cheng, X., Wang, Z., Ristau, D., Wren Carr, Christopher, Exarhos, Gregory J., Gruzdev, Vitaly E., Ristau, Detlev, Soileau, M.J.
Publikováno v:
Proceedings of SPIE 10805 (2018)
Previous studies have shown that nanometer scale defects can lead to the formation of submicrometer craters, if located in coatings with a relatively small thickness. Due to the small size, such damages are challenging to detect in the online and off