Zobrazeno 1 - 5
of 5
pro vyhledávání: '"D. N. Khmelenin"'
Autor:
N. K. Chumakov, M. A. Chuev, N. I. Snegirev, M. B. Strugatsky, S. V. Yagupov, Igor S. Lyubutin, O. M. Zhigalina, D. N. Khmelenin
Publikováno v:
Russian Journal of Inorganic Chemistry. 66:1217-1222
Nanosized iron borate particles have been fabricated by mechanical grinding of FeBO3 single crystals. The phase and chemical composition of the samples have been studied by electron diffraction and X-ray energy dispersive analysis. The morphology of
Autor:
Igor S. Lyubutin, D. N. Khmelenin, I. A. Gudim, K. V. Frolov, Ekaterina Smirnova, Olga A. Alekseeva, Alexander P. Dudka, Marianna V. Lyubutina
Publikováno v:
Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials. 75:954-968
An accurate single-crystal X-ray diffraction study of bismuth-containing HoFe3(BO3)4between 11 and 500 K has revealed structural phase transition atTstr= 365 K. The Bi atoms enter the composition from Bi2Mo3O12-based flux during crystal growth and si
Autor:
S. G. Zybtsev, D. N. Khmelenin, E. Tchernychova, O. M. Zhigalina, Damir Starešinić, Sašo Šturm, V. Ya. Pokrovskii
Publikováno v:
Journal of Experimental and Theoretical Physics. 124:665-677
The uniaxial strain of quasi-one-dimensional conductor whiskers of orthorhombic TaS3 at a strain higher than e c ~ 0.8% leads to a sharp increase in the coherence of the properties of a charge density wave (CDW), which manifests itself in its motion
Autor:
G. Sh. Usmanova, D. N. Khmelenin, Elena N. Sheftel, A. Carlsson, O. M. Zhigalina, A. L. Vasil’ev
Publikováno v:
Crystallography Reports. 58:344-354
The effect of deposition conditions (film thickness) on the structure of soft magnetic Fe80–78Zr10N10–12 films formed by reactive magnetron deposition on a heat-resistant glass substrate has been investigated by analytical transmission electron m
Autor:
O. M. Zhigalina, K. A. Vorotilov, A. A. Mazitov, D. N. Khmelenin, N. M. Kotova, N. B. D’yakonova, I. S. Seregin
Publikováno v:
Physics of the Solid State. 54:997-998
The transmission electron microscopy, energy-dispersive, and X-ray powder diffraction analyses have been used to study the changes in the structure and phase composition of lanthanum-doped BiFeO3 and undoped BiFeO3 thin films synthesized by chemical