Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Xinyi Hu"'
Autor:
Xinyi Hu, Hangxiang Fang, Ling Zhang, Xue Zhang, Howard H. Yang, Dongxiao Yang, Bo Peng, Zheyang Li, Haoji Hu
Publikováno v:
Applied Intelligence.
Publikováno v:
IEEE Journal of Selected Topics in Signal Processing. 14:775-788
Modern Convolutional Neural Networks (CNNs) are usually restricted by their massive computation and high storage. Parameter pruning is a promising approach for CNN compression and acceleration by eliminating redundant model parameters with tolerable
Publikováno v:
Journal of the Royal Statistical Society Series A: Statistics in Society. 183:631-654
Summary Rejection inference aims to reduce sample bias and to improve model performance in credit scoring. We propose a semisupervised clustering approach as a new rejection inference technique. K-prototype clustering can deal with mixed types of num
Publikováno v:
CCCI
The Internet is about to enter the era of full encryption. Traditional traffic classification methods only work well in non-encrypted environments. How to identify the specific types of network encrypted traffic in an encrypted environment without de
Autor:
Qijian Wan, Marfei Fei, Jet Jiang, Frank Hou, Elven Huang, Gavin Li, David Wang, Summy Chen, Liang Cao, Saikiran Madhusudhan, Sankaranarayanan Paninjath, Leo Tian, Chunshan Du, Xinyi Hu, Qian Xie
Publikováno v:
2020 International Workshop on Advanced Patterning Solutions (IWAPS).
As the semiconductor manufacturing continues its march towards more advanced technology nodes, design and process introduced systematic defects become significant yield limiters [1]. Therefore, identification and characterization of these systematic
Publikováno v:
VCIP
Although the facial makeup transfer network has achieved high-quality performance in generating perceptually pleasing makeup images, its capability is still restricted by the massive computation and storage of the network architecture. We address thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41d87661b60abcbf4967f33506559ec7
http://arxiv.org/abs/2009.07604
http://arxiv.org/abs/2009.07604
Autor:
Marfe Ma, Kuan Hu, Elven Huang, Xinyi Hu, Zhengfang Liu, Jet Jiang, Chunshan Du, Qijian Wan, Wael ElManhawy, Gavin Li, Frank Hou
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XIV.
Silicon weak pattern exploration becomes more and more attractive for yield improvement and design robustness as these proven silicon weak patterns or hotspots directly reveals process weakness and should be avoided to occur on the chip design. At th
Publikováno v:
Measurement. 157:107638
To improve the precision of traditional binocular reconstruction technology and better serve the traffic safety, laser line constraint was firstly introduced. Then three different matching modes, namely the default color, enhanced target line and reg
Autor:
Xinyi Hu, Yaqun Zhao
Publikováno v:
ACIT
Distinguishing analysis is an important part of cryptanalysis. It is an important content of discriminating analysis that how to identify ciphertext is encrypted by which cryptosystems when it knows only ciphertext. In this paper, Fisher's discrimina
Autor:
Robben Lee, Qijian Wan, Xinyi Hu, Tyzy Lee, Chunshan Du, Hermes Liu, Helen Li, Teddy Xue, Zhengfang Liu, Hall Wu
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XII.
As technology advances, escalating layout design complexity and chip size make defect inspection becomes more challenging than ever before. The YE (Yield Enhancement) engineers are seeking for an efficient strategy to ensure accuracy without sufferin