Zobrazeno 1 - 10
of 21
pro vyhledávání: '"N. Schell"'
Autor:
Tomasz Gancarz, A. Dobosz, Robert Chulist, Hani Henein, N. Schell, A.-A. Bogno, Grzegorz Cempura
Publikováno v:
Gancarz, T.; Dobosz, A.; Bogno, A.; Cempura, G.; Schell, N.; Chulist, R.; Henein, H.: Characterization of rapidly solidified Al-Mg-Sc alloys with Li addition. In: Materials Characterization. Vol. 178 (2021) 111290. (DOI: /10.1016/j.matchar.2021.111290)
Materials characterization 178, 111290 (2021). doi:10.1016/j.matchar.2021.111290
Materials characterization 178, 111290 (2021). doi:10.1016/j.matchar.2021.111290
Materials characterization 178, 111290 (2021). doi:10.1016/j.matchar.2021.111290
This paper investigate the thermophysical properties of the liquid as well as the rapid solidification ofAl5.0Mg0.2Sc alloys with 3.0 and 6.0 Li wt% by the discharg
This paper investigate the thermophysical properties of the liquid as well as the rapid solidification ofAl5.0Mg0.2Sc alloys with 3.0 and 6.0 Li wt% by the discharg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3cd600b05cc436683ec04bc4e39e2c96
Autor:
Helfried Reuther, Rui M. S. Martins, Arndt Mücklich, Rui J.C. Silva, Manfred Beckers, F.M. Braz Fernandes, N. Schell, Luís Pereira
Publikováno v:
Applied Physics A 91(2008)2, 291-299
Martins, R.M.S.; Schell, N.; Muecklich, A.; Reuther, H.; Beckers, M.; Silva, R.J.C.; Pereira, L.; Braz Fernandes, F.M.: Study of graded Ni-Ti shape memory alloy film growth on Si(100) substrate. In: Applied Physics A. Vol. 91 (2008) 2, 291-299. (DOI: 10.1007/s00339-008-4397-2)
Martins, R.M.S.; Schell, N.; Muecklich, A.; Reuther, H.; Beckers, M.; Silva, R.J.C.; Pereira, L.; Braz Fernandes, F.M.: Study of graded Ni-Ti shape memory alloy film growth on Si(100) substrate. In: Applied Physics A. Vol. 91 (2008) 2, 291-299. (DOI: 10.1007/s00339-008-4397-2)
In-situ x-ray diffraction (XRD) was employed to study the effect of the deliberate change of the ratio Ti/Ni during the deposition of Ni-Ti films. Thus, graded films were deposited exhibiting distinctive composition and crystalline structure along th
Autor:
K. U. Kainer, Norbert Hort, N. Schell, Heinz-Peter Reichel, Andreas Stark, Domonkos Tolnai, R. Brückner, Björn Wiese, Chamini Lakshi Mendis
Publikováno v:
Wiese, B.; Mendis, C.L.; Tolnai, D.; Stark, A.; Schell, N.; Reichel, H.-P.; Brueckner, R.; Kainer, K.U.; Hort, N.: CaO dissolution during melting and solidification of a Mg–10 wt.% CaO alloy detected with in situ synchrotron radiation diffraction. In: Journal of Alloys and Compounds. Vol. 618 (2015) 64-66. (DOI: 10.1016/j.jallcom.2014.08.151)
Wiese, B, Mendis, C L, Tolnai, D, Stark, A, Schell, N, Reichel, H P, Brückner, R, Kainer, K U & Hort, N 2015, ' CaO dissolution during melting and solidification of a Mg-10 wt.% CaO alloy detected with in situ synchrotron radiation diffraction ', Journal of Alloys and Compounds, vol. 618, pp. 64-66 . https://doi.org/10.1016/j.jallcom.2014.08.151
Wiese, B, Mendis, C L, Tolnai, D, Stark, A, Schell, N, Reichel, H P, Brückner, R, Kainer, K U & Hort, N 2015, ' CaO dissolution during melting and solidification of a Mg-10 wt.% CaO alloy detected with in situ synchrotron radiation diffraction ', Journal of Alloys and Compounds, vol. 618, pp. 64-66 . https://doi.org/10.1016/j.jallcom.2014.08.151
The phase dissolution and evolution during the melting and the solidification of Mg containing 10 wt.% CaO was investigated in the temperature range of 20-680 °C. The dissolution of CaO and the formation of Mg2Ca were detected with in situ synchrotr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8f19d8e12e250549fa3157d3a3833e20
https://publications.hereon.de/id/32212
https://publications.hereon.de/id/32212
Autor:
K. U. Kainer, Norbert Hort, Henry Ovri, N. Schell, Domonkos Tolnai, Rainer Schmid-Fetzer, Martin Wolff, Chamini Lakshi Mendis, Andreas Stark, G. Szakács, Joachim Gröbner
Publikováno v:
Magnesium Technology 2015 ISBN: 9783319486116
Magnesium Technology 2015
Magnesium Technology 2015
In situ synchrotron radiation diffraction experiments were performed during the solidification of Mg15Gd at the P07 (HEMS) Beamline of PETRA III at DESY. The measurements were carried out in the chamber of a modified DIL 805A/D dilatometer with a bea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b728e3af8a1c149f01505e1d8ab0158
https://doi.org/10.1007/978-3-319-48185-2_17
https://doi.org/10.1007/978-3-319-48185-2_17
Publikováno v:
Thin Solid Films. :275-279
This work focuses on the role of the native oxide layer (SiO2) on the nickel (Ni)-assisted crystallization of amorphous silicon (a-Si). In some samples, the native oxide was removed using a HF-diluted solution before Ni layers with 0.5 nm be deposite
Autor:
Francisco Manuel Braz Fernandes, Rui J.C. Silva, Manfred Beckers, N. Schell, Rui M. S. Martins, Karimbi Koosappa Mahesh
Publikováno v:
Applied Physics A. 84:285-289
In-situ X-ray diffraction (XRD) during the growth of Ni-Ti thin films was chosen in order to investigate their texture development using a deposition chamber installed at a synchrotron radiation beamline. Near-equiatomic films were co-sputtered from
Autor:
Rui J.C. Silva, Manuel J.P. Maneira, Manfred Beckers, Luís Pereira, N. Schell, Paulo Gordo, F.M. Braz Fernandes, A. Mücklich, Rui M. S. Martins
Publikováno v:
Applied Physics A. 83:139-145
Shape memory alloy Ni-Ti thin films as sputtered are amorphous if the substrate is not intentionally heated during deposition. Therefore, these films have to be heat treated to induce crystallization in order to exhibit the shape-memory effect. Sever
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 23:1384-1391
In situ x-ray diffraction was employed during the growth of thin Ti1−xAlxN films, using a deposition chamber installed at a synchrotron radiation beamline. The films were deposited by reactive cosputtering from Ti and Al targets. In a previous expe
Autor:
N. Schell, Thomas Gessner, K. Wetzig, T. Kammler, H. Prinz, Ehrenfried Zschech, J. Rinderknecht
Publikováno v:
Microelectronic Engineering 70 (2003) 226-232
The formation of nickel silicides has been studied by X-ray diffraction experiments using synchrotron radiation (SR). A high temperature chamber was used to investigate the phase formation and transition processes under quasi-static conditions at tem
Publikováno v:
Nuclear Instruments & Methods B 199 (2003) 54-58
The surface hardness of the technically important alloy Ti–6Al–4V (wt.%) can be improved by nitrogen implantation. The structural mechanisms of hardening and of the stability of the improved hardness at elevated temperatures are studied. Ion impl