Zobrazeno 1 - 2
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pro vyhledávání: '"Yiming Qu"'
Publikováno v:
IRPS
Self-heating effect (SHE) in aggressively scaled SOI FinFETs is experimentally and quantitatively investigated by utilizing a sub-nanosecond (ns) characterization technique. A 3D mapping of the channel temperature rise is obtained under different hea
Publikováno v:
Microelectronics Reliability. 85:93-98
In this paper, a novel method is proposed for the extraction of the transistor electrical parameters at the nanosecond timescale. This technique is enabled by an ultra-fast measurement (UFM) system that mainly contains the arbitrary waveform generato