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pro vyhledávání: '"Shen, Yue"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 900-906 (2018)
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology
The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping
Publikováno v:
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 1146-1155 (2018)
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 1146-1155 (2018)
Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample. Based on the dielectric c