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pro vyhledávání: '"Liu, Chun-Chen"'
Autor:
Liu, Jinglan, Ding, Yukun, Xiong, Jinjun, Jia, Qianjun, Huang, Meiping, Zhuang, Jian, Xie, Bike, Liu, Chun-Chen, Shi, Yiyu
CT image denoising can be treated as an image-to-image translation task where the goal is to learn the transform between a source domain $X$ (noisy images) and a target domain $Y$ (clean images). Recently, cycle-consistent adversarial denoising netwo
Externí odkaz:
http://arxiv.org/abs/2002.12130
For nanotechnology nodes, the feature size is shrunk rapidly, the wire becomes narrow and thin, it leads to high RC parasitic, especially for resistance. The overall system performance are dominated by interconnect rather than device. As such, it is
Externí odkaz:
http://arxiv.org/abs/1701.03181
For nanotechnology, the semiconductor device is scaled down dramatically with additional strain engineering for device enhancement, the overall device characteristic is no longer dominated by the device size but also circuit layout. The higher order
Externí odkaz:
http://arxiv.org/abs/1701.00460