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pro vyhledávání: '"Sun, Jin"'
Autor:
Sun, Jin
As device feature sizes shrink to nano-scale, continuous technology scaling has led to a large increase in parameter variability during semiconductor manufacturing process. According to the source of uncertainty, parameter variations can be classifie
Externí odkaz:
http://hdl.handle.net/10150/145458
published_or_final_version
Education
Doctoral
Doctor of Philosophy
Education
Doctoral
Doctor of Philosophy
Autor:
Sun, Jin-Bor
Digitized by Kansas Correctional Industries
Externí odkaz:
http://hdl.handle.net/2097/10201