Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jürgen Pilz"'
Publikováno v:
Risk Analysis. 35:1623-1639
In this article, Bayesian networks are used to model semiconductor lifetime data obtained from a cyclic stress test system. The data of interest are a mixture of log-normal distributions, representing two dominant physical failure mechanisms. Moreove
Publikováno v:
Quality and Reliability Engineering International. 30:363-373
In semiconductor manufacturing, it is a key to ensure reliability of the produced devices. The population's reliability level is demonstrated by means of a burn-in study (that is investigating a large number of devices under real-life stress conditio