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Autor:
Shen, Lin
Publikováno v:
Electronic Theses and Dissertations.
This thesis work is mainly focused on studying RF performance degradation of a low noise amplifier (LNA) circuit due to hot carrier effect (HCE) in both the weak and strong inversion regions. Since the figures of merit for the RF circuit characteriza
Autor:
Shen, Lin
Publikováno v:
Electronic Theses and Dissertations.
This thesis work is mainly focused on studying RF performance degradation of a low noise amplifier (LNA) circuit due to hot carrier effect (HCE) in both the weak and strong inversion regions. Since the figures of merit for the RF circuit characteriza