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pro vyhledávání: '"H. Graafsma"'
Autor:
H. Graafsma, Vedran Vonk
Publikováno v:
In-situ Materials Characterization ISBN: 9783642451515
X-ray Diffraction (XRD) is an outstanding tool for structural analyses at the atomic scale, and both the experimental techniques and the theoretical interpretations are well established. X-rays also have the advantage of being highly penetrating, as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d943dad86a0c080141cb01907ec8c622
https://doi.org/10.1007/978-3-642-45152-2_2
https://doi.org/10.1007/978-3-642-45152-2_2