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Autor:
Lada V. Yashina, Fumihiko Matsui, Ilya I. Ogorodnikov, M. V. Kuznetsov, Dmitry Yu. Usachov, Denis V. Vyalikh, Clemens Laubschat
Publikováno v:
Digital.CSIC: Repositorio Institucional del CSIC
Consejo Superior de Investigaciones Científicas (CSIC)
Digital.CSIC. Repositorio Institucional del CSIC
instname
Consejo Superior de Investigaciones Científicas (CSIC)
Digital.CSIC. Repositorio Institucional del CSIC
instname
Photoelectron diffraction (XPD) and holography (XPH) are powerful spectroscopic methods that allow comprehensive exploration and characterization of certain structural properties of materials, in particular those of 2D systems and interfaces. Recent
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::50bf4eb8e15d5b00da704d391dd1dd4f