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pro vyhledávání: '"Fuei Pien Chee"'
Autor:
Haider F. Abdul Amir, Fuei Pien Chee
Publikováno v:
Journal of Computers. 9
Performance and properties of bipolar junction transistor (BJT) devices are affected due to the harsh radiation environment. This report reviews the typical effects occurring in BJT devices due to irradiation with x-rays. The defect parameters on the