Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Ying Yen"'
Publikováno v:
IEEE Access. 10:99850-99860
Autor:
Chia-Heng Yen, Chun-Teng Chen, Cheng-Yen Wen, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. :1-1
Autor:
Chien-Hsueh Lin, Kao-Chi Lee, Ying-Yen Chen, Jih-Nung Lee, Mango C.-T. Chao, Sung-Chu Yu, Chih-Ying Tsai, Wen-Rong Liau, Alex Hou, Chun-Yi Kuo
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37:2139-2151
To measure the variation of device $V_{t}$ requires long test for conventional wafer acceptance test (WAT) test structures. This paper presents a framework that can efficiently and effectively obtain the mean and variance of $V_{t}$ for a large numbe
Publikováno v:
IEEE Design & Test of Computers. 27:31-41
To ensure reliable test data communication in a wireless test system, information can be encapsulated in packets equipped with error correction and retransmission capability. Systems employing such an approach require a complex test interface (test w
Autor:
Jing-Jia Liou, Ying-Yen Chen
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 16:755-765
Diagnosis tools can be used to speed up the process for finding the root causes of functional or performance problems in a VLSI circuit. In this paper, we propose a method to locate possible segments that cause extra delays on circuit paths. We use t