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pro vyhledávání: '"Inhwan Lee"'
Publikováno v:
IEEE Transactions on Power Electronics. 37:4708-4718
In this paper, a fault detection and isolation technique for series arc faults in dc microgrids with multiple power electronics loads is proposed using Unknown Input Observers (UIO). The dc microgrid is first modeled as a linear system using its corr
Publikováno v:
IEEE Solid-State Circuits Letters. 5:70-73
Autor:
Inhwan Lee, Xiu Yao
Publikováno v:
IEEE Open Journal of Power Electronics, Vol 2, Pp 43-55 (2021)
Series connection of multiple transistors is an attractive solution to achieve higher voltage capability. However, the voltage imbalance among the series-connected devices is a critical issue caused by mismatches of device characteristics and gate si
Autor:
Sangmoo Choi, Keum-Nam Kim, Inhwan Lee, Do-Hyung Ryu, Oh-Kyong Kwon, Hye-Dong Kim, Hai-Jung In, Kyonghwan Oh
Publikováno v:
IEEE Transactions on Electron Devices. 57:3012-3019
An advanced method for externally compensating the nonuniform electrical characteristics of polycrystalline silicon thin-film transistors (TFTs) and the degradation of organic light-emitting diode (OLED) devices is proposed, and the method is verifie
Autor:
Ravishankar K. Iyer, Inhwan Lee
Publikováno v:
IEEE Transactions on Software Engineering. 21:455-467
Based on extensive field failure data for Tandem's GUARDIAN operating system, the paper discusses evaluation of the dependability of operational software. Software faults considered are major defects that result in processor failures and invoke backu