Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Werner N"'
Publikováno v:
IEEE Access, Vol 11, Pp 125421-125438 (2023)
The capabilities of a parametric model for crack patterns simulation are presented. Planar tessellations are partitions of the plane into convex polygons (called cells) without overlapping. The Voronoi tessellations and Poisson line tessellations are
Externí odkaz:
https://doaj.org/article/60e6f42462d74d8dadd867a9d94e5d3e
Publikováno v:
IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), 2011; 2011, p499-504, 6p
Publikováno v:
2016 International Semiconductor Laser Conference (ISLC); 2016, p1-2, 2p