Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Kim, Changsu"'
Publikováno v:
In Journal of Membrane Science 1 February 2021 619
Publikováno v:
In Electronic Commerce Research and Applications July-August 2012 11(4):374-387
Publikováno v:
In Electronic Commerce Research and Applications 2010 9(1):84-95
Autor:
Kim, Changsu1 cskim@sogang.ac.kr, Kim, Jungkeun2 kim.jungkeun@aut.ac.nz, Marshall, Roger2 roger.marshall@aut.ac.nz, Afzali, Hajir1
Publikováno v:
Journal of Business Research. Oct2018, Vol. 91, p40-47. 8p.
Autor:
Kim, Changsu1 c.kim@ynu.ac.kr, Kim, Dan J.2 Dan.Kim@unt.edu
Publikováno v:
International Journal of Information Management. Dec2017, Vol. 37 Issue 6, p553-565. 13p.
Publikováno v:
Journal of Business Research. Aug2012, Vol. 65 Issue 8, p1189-1194. 6p.
Autor:
Kim, Changsu1 cskim@ewha.ac.kr, Song, Jaeyong2 jsong@snu.ac.kr
Publikováno v:
Technovation. Aug2007, Vol. 27 Issue 8, p461-470. 10p.
Autor:
Kim, Changsu1 c.kim@yumail.ac.kr, Yang, Kyung Hoon2 yang.kyun@uwlax.edu, Kim, Jaekyung3 jkim6@unl.edu
Publikováno v:
Omega. Aug2008, Vol. 36 Issue 4, p522-534. 13p.
Autor:
Kim, Changsu1 c.kim@ynu.ac.kr, Oh, Eunhae1 oeh89@hanmail.net, Shin, Namchul2 nshin@pace.edu, Chae, Myungsin3 mschae@suv.ac.kr
Publikováno v:
International Journal of Information Management. Dec2009, Vol. 29 Issue 6, p436-448. 13p.
Autor:
Phansalkar, Sukrut Prashant1 (AUTHOR), Kim, Changsu1 (AUTHOR), Han, Bongtae1 (AUTHOR) bthan@umd.edu
Publikováno v:
Microelectronics Reliability. Mar2022, Vol. 130, pN.PAG-N.PAG. 1p.