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Autor:
Fulthorpe, Brian David
The scattering mechanisms responsible for Giant Magneto-Resistance (OMR) in magnetic multilayers are believed to be related to many aspects of the multilayer structure. X-ray scattering techniques provide a powerful method with which to study the bul
Externí odkaz:
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.298535
Autor:
Clarke, John
The non-destructive study and characterisation of thin films and their interfaces, on an atomic scale, is a crucially important area of study in many areas of science and technology. In this thesis both high angle and grazing incidence x-ray scatteri
Externí odkaz:
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.302376