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pro vyhledávání: '"Jörg Schilling"'
Publikováno v:
Physical Review E. 69
Dual-wavelength reflection interference contrast microscopy (DW-RICM) is established as a microinterferometric technique to measure absolute optical distances between transparent planar substrates and hard or soft surfaces such as colloidal beads or
Publikováno v:
Scopus-Elsevier
Ultrafast tuning of the band edge of a two-dimensional silicon/air photonic crystal is demonstrated near a wavelength of 1.9 mm. Changes in the silicon refractive index are optically induced by injecting free carriers with 800 nm, 300 fs pulses. The