Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Ahn CH"'
Autor:
Jo S; Center for Theragnosis, Biomedical Research Institute, Korea Institute of Science and Technology, 5, Hwarang-ro, Seongbuk-gu, Seoul 02792, Republic of Korea.; Research Institute of Advanced Materials (RIAM), Department of Materials Science and Engineering, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul08826, Republic of Korea., Sun IC; Center for Theragnosis, Biomedical Research Institute, Korea Institute of Science and Technology, 5, Hwarang-ro, Seongbuk-gu, Seoul 02792, Republic of Korea., Ahn CH; Research Institute of Advanced Materials (RIAM), Department of Materials Science and Engineering, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul08826, Republic of Korea., Lee S; Department of Pharmacy, College of Pharmacy, Kyung Hee University, 26 Kyungheedae-ro, Dongdaemun-gu, Seoul02447, Korea., Kim K; Center for Theragnosis, Biomedical Research Institute, Korea Institute of Science and Technology, 5, Hwarang-ro, Seongbuk-gu, Seoul 02792, Republic of Korea.; KU-KIST Graduate School of Converging Science and Technology, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 02841, Republic of Korea.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Jan 11; Vol. 15 (1), pp. 120-137. Date of Electronic Publication: 2022 Feb 19.
Autor:
Joh S; Safety Measurement Institute, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Korea.; Department of Nano Science, University of Science and Technology (UST), Daejeon 34113, Korea., Na HK; Safety Measurement Institute, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Korea., Son JG; Safety Measurement Institute, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Korea., Lee AY; Safety Measurement Institute, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Korea., Ahn CH; Department of Laboratory Medicine, Yonsei University College of Medicine, Seoul 03722, Korea., Ji DJ; Department of Laboratory Medicine, Yonsei University College of Medicine, Seoul 03722, Korea., Wi JS; Department of Materials Science and Engineering, Hanbat National University, Daejeon 34158, Korea., Jeong MS; Department of Physics, Hanyang University, Seoul 04763, Korea., Lee SG; Department of Laboratory Medicine, Yonsei University College of Medicine, Seoul 03722, Korea., Lee TG; Safety Measurement Institute, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Korea.; Department of Nano Science, University of Science and Technology (UST), Daejeon 34113, Korea.
Publikováno v:
ACS nano [ACS Nano] 2021 Jun 22; Vol. 15 (6), pp. 10141-10152. Date of Electronic Publication: 2021 Jun 07.
Autor:
Deshpande NG; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea., Kim DS; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea., Ahn CH; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea., Jung SH; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea., Kim YB; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea., Lee HS; School of Materials Science and Engineering, Kyungpook National University, 80 Daehakro, Buk-gu, Daegu 41566, Republic of Korea., Cho HK; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea.; Research Center for Advanced Materials Technology, Sungkyunkwan University (SKKU), 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Republic of Korea.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2021 Apr 28; Vol. 13 (16), pp. 18772-18783. Date of Electronic Publication: 2021 Apr 15.
Autor:
Tai LC; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.; Berkeley Sensor and Actuator Center, University of California, Berkeley, California 94720, United States.; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Ahn CH; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States., Nyein HYY; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.; Berkeley Sensor and Actuator Center, University of California, Berkeley, California 94720, United States.; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Ji W; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.; Berkeley Sensor and Actuator Center, University of California, Berkeley, California 94720, United States.; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Bariya M; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.; Berkeley Sensor and Actuator Center, University of California, Berkeley, California 94720, United States.; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Lin Y; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.; Berkeley Sensor and Actuator Center, University of California, Berkeley, California 94720, United States.; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Li L; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Javey A; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.; Berkeley Sensor and Actuator Center, University of California, Berkeley, California 94720, United States.; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
Publikováno v:
ACS sensors [ACS Sens] 2020 Jun 26; Vol. 5 (6), pp. 1831-1837. Date of Electronic Publication: 2020 May 28.
Autor:
Upaassana VT; Microsystems and BioMEMS Laboratory, Department of Electrical Engineering and Computer Science , University of Cincinnati , Cincinnati , Ohio 45221 , United States., Ghosh S; Microsystems and BioMEMS Laboratory, Department of Electrical Engineering and Computer Science , University of Cincinnati , Cincinnati , Ohio 45221 , United States., Chakraborty A; Microsystems and BioMEMS Laboratory, Department of Electrical Engineering and Computer Science , University of Cincinnati , Cincinnati , Ohio 45221 , United States., Birch ME; Centers for Disease Control and Prevention (CDC), National Institute for Occupational Safety and Health (NIOSH) , Division of Applied Research and Technology , 1090 Tusculum Avenue , Cincinnati , Ohio 45226 , United States., Joseph P; Centers for Disease Control and Prevention (CDC), National Institute for Occupational Safety and Health (NIOSH) , Health Effects Laboratory Division , 1095 Willowdale Road , Morgantown , West Virginia 26505 , United States., Han J; Mico BioMed USA Inc. , 10999 Reed Hartman Highway , STE 309C, Cincinnati , Ohio 45242 , United States., Ku BK; Centers for Disease Control and Prevention (CDC), National Institute for Occupational Safety and Health (NIOSH) , Division of Applied Research and Technology , 1090 Tusculum Avenue , Cincinnati , Ohio 45226 , United States., Ahn CH; Microsystems and BioMEMS Laboratory, Department of Electrical Engineering and Computer Science , University of Cincinnati , Cincinnati , Ohio 45221 , United States.
Publikováno v:
Analytical chemistry [Anal Chem] 2019 May 21; Vol. 91 (10), pp. 6652-6660. Date of Electronic Publication: 2019 May 01.
Autor:
Kim KS; School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon , Gyeonggi-do 16419 , Republic of Korea., Ahn CH; School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon , Gyeonggi-do 16419 , Republic of Korea., Jung SH; School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon , Gyeonggi-do 16419 , Republic of Korea., Cho SW; School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon , Gyeonggi-do 16419 , Republic of Korea., Cho HK; School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon , Gyeonggi-do 16419 , Republic of Korea.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2018 Mar 28; Vol. 10 (12), pp. 10185-10193. Date of Electronic Publication: 2018 Mar 19.
Autor:
Dogan M, Fernandez-Peña S; Department of Quantum Matter Physics, Université de Genève , Genève 1211, Switzerland., Kornblum L, Jia Y, Kumah DP, Reiner JW, Krivokapic Z; GLOBALFOUNDRIES, Santa Clara, California 95054, United States., Kolpak AM; Department of Mechanical Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States., Ismail-Beigi S, Ahn CH, Walker FJ
Publikováno v:
Nano letters [Nano Lett] 2018 Jan 10; Vol. 18 (1), pp. 241-246. Date of Electronic Publication: 2017 Dec 26.
Autor:
Malashevich A; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States.; Department of Applied Physics, Yale University , New Haven, Connecticut 06520, United States., Marshall MSJ; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States.; Department of Applied Physics, Yale University , New Haven, Connecticut 06520, United States., Visani C; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States.; Department of Applied Physics, Yale University , New Haven, Connecticut 06520, United States., Disa AS; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States., Xu H; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States.; Department of Applied Physics, Yale University , New Haven, Connecticut 06520, United States.; Advanced Materials Laboratory, Fudan University , Shanghai 200433, People's Republic of China., Walker FJ; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States.; Department of Applied Physics, Yale University , New Haven, Connecticut 06520, United States., Ahn CH; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States.; Department of Applied Physics, Yale University , New Haven, Connecticut 06520, United States.; Department of Mechanical Engineering and Materials Science, Yale University , New Haven, Connecticut 06520, United States.; Department of Physics, Yale University , New Haven, Connecticut 06520, United States., Ismail-Beigi S; Center for Research on Interface Structures and Phenomena (CRISP), Yale University , New Haven, Connecticut 06520, United States.; Department of Applied Physics, Yale University , New Haven, Connecticut 06520, United States.; Department of Mechanical Engineering and Materials Science, Yale University , New Haven, Connecticut 06520, United States.; Department of Physics, Yale University , New Haven, Connecticut 06520, United States.
Publikováno v:
Nano letters [Nano Lett] 2018 Jan 10; Vol. 18 (1), pp. 573-578. Date of Electronic Publication: 2017 Dec 26.
Autor:
Um S, Bach DH, Shin B, Ahn CH, Kim SH, Bang HS; Research Policy Bureau , Rural Development Administration, Jeonju, Jeolabuk-do 54875, Republic of Korea., Oh KB, Lee SK, Shin J, Oh DC
Publikováno v:
Organic letters [Org Lett] 2016 Nov 18; Vol. 18 (22), pp. 5792-5795. Date of Electronic Publication: 2016 Nov 08.
Autor:
Li H; Division of Pharmaceutics, College of Pharmacy, The Ohio State University , Columbus, Ohio 43210, United States., Quan J; Division of Pharmaceutics, College of Pharmacy, The Ohio State University , Columbus, Ohio 43210, United States., Zhang M; Molecular, Cellular and Developmental Biology Program, The Ohio State University , Columbus, Ohio 43210, United States., Yung BC; Division of Pharmaceutics, College of Pharmacy, The Ohio State University , Columbus, Ohio 43210, United States., Cheng X; Department of Biomedical Engineering, The Ohio State University , Columbus, Ohio 43210, United States., Liu Y; Division of Pharmaceutics, College of Pharmacy, The Ohio State University , Columbus, Ohio 43210, United States., Lee YB; Rexahn Pharmaceuticals, Inc. , Rockville, Maryland 20850, United States., Ahn CH; Rexahn Pharmaceuticals, Inc. , Rockville, Maryland 20850, United States., Kim DJ; Rexahn Pharmaceuticals, Inc. , Rockville, Maryland 20850, United States., Lee RJ; Division of Pharmaceutics, College of Pharmacy, The Ohio State University , Columbus, Ohio 43210, United States.
Publikováno v:
Molecular pharmaceutics [Mol Pharm] 2016 Jul 05; Vol. 13 (7), pp. 2555-62. Date of Electronic Publication: 2016 Jun 16.