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Autor:
Pershyn, Yuriy P., Devizenko, A.Yu., Zubarev, Evgeniy N., Kondratenko, Valeriy V., Voronov, Dmitriy L., Gullikson, E. M.
Methods of X-ray reflectometry λ0.154 nm), cross-sectional transmission electron microscopy and re flectometry in the EUV region (λ = 41-51 nm) were used to investigate the barrier properties of CrB2 layers 0.3-1.3 nm thick in Sc/CrB2/Si multilayer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3033::0151d4b89f883117c7922393b94b52bb
http://repository.kpi.kharkov.ua/handle/KhPI-Press/58682
http://repository.kpi.kharkov.ua/handle/KhPI-Press/58682