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pro vyhledávání: '"Yang, Qingxin"'
Autor:
Duyan G; Province-Ministry Joint Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability, Hebei University of Technology, Tianjin 300130, China. dygeng@hebut.edu.cn, Xu G, Yu H, Yang S, Yang Q, Yan W
Publikováno v:
Annual International Conference of the IEEE Engineering in Medicine and Biology Society. IEEE Engineering in Medicine and Biology Society. Annual International Conference [Annu Int Conf IEEE Eng Med Biol Soc] 2008; Vol. 2008, pp. 1331-4.