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Autor:
Nainani, Aneesh, Irisawa, Toshifumi, Yuan, Ze, Bennett, Brian R., Boos, J. Brad, Nishi, Yoshio, Saraswat, Krishna C.
Publikováno v:
IEEE Transactions on Electron Devices; Oct2011, Vol. 58 Issue 10, p3407-3415, 9p