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pro vyhledávání: '"Nicholas Bembridge"'
Autor:
Ke Han, Steven T. Downey, Nicholas Bembridge, Gregory S. Rohrer, Peter N. Kalu, Herbert M. Miller
Publikováno v:
Journal of Materials Science. 42:9543-9547
A stereological analysis of electron backscatter diffraction data has been used to measure the five-parameter grain boundary character distribution of chemically modified 316LN stainless steel exposed to both elevated and cryogenic temperature. The r