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Autor:
Guido Schmitz, V. Vovk
Publikováno v:
Ultramicroscopy. 109:637-643
Critical limitations exist regarding the thermal stability of multilayer giant magnetoresistance (GMR) sensors due to significant contribution of layer interfaces and grain boundaries to their performance. This paper addresses the stability of, and t
Autor:
Yi-Hung Chiao, David R. Clarke
Publikováno v:
Ultramicroscopy. 29:203-211
The emission of dislocations from crack tips in silicon under combined conditions of temperature and stress is observed in-situ at 550 to 750°C, using transmission electron microscopy. Recording on video tape the dislocation emission and the subsequ