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Autor:
Aneesh Prabhakaran, Sami Yunus, Nimer Wehbe, Karim Hamraoui, Patrick Bertrand, Arnaud Delcorte, Oscar A. Restrepo
Publikováno v:
Surface and Interface Analysis
This article compares the experimental results obtained in metal-assisted secondary ion mass spectrometry of polymers, with molecular dynamics simulations involving hybrid metal-organic surfaces. The theoretical sputtering yields are in agreement wit
Autor:
N. S. McIntyre, J. T. Francis
Publikováno v:
Surface and Interface Analysis. 37:743-748
This work documents the behaviour of the positive secondary ion yield of bulk polytetrafluoroethylene (PTFE) under dual-beam depth profiling conditions employing 1 keV Ar+, Cs+ and SF5+. A unique chemical interaction is observed in the form of a dram
Autor:
Mineharu Suzuki, Gregory L. Fisher, Shin-ichi Iida, Takuya Miyayama, Scott R. Bryan, Noriaki Sanada
Publikováno v:
Surface and Interface Analysis. 43:214-216
The introduction of C 60 + as a sputter ion beam for ToF-SIMS has made it possible to acquire molecular depth profiles on a wide varietyof polymers. However, previous studies have indicated that certain classes of polymers undergo sputter-induced dam
Publikováno v:
Surface and Interface Analysis. 12:486-490
Thermally evaporated aluminium thin layers have been deposited on two different industrial Polyester (PET) films. The Peel test shows that adhesion between Al films and PET depends on the heat setting conditions of the PET foils. In order to explain