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Autor:
Masae Inoue, Atsushi Murase
Publikováno v:
Surface and Interface Analysis. 37:1111-1114
We investigated reduction of the matrix effect in time-of-flight secondary ion mass spectrometry (TOF-SIMS) analysis by the deposition of a small amount of metal on the sample surfaces (metal-assisted SIMS or MetA-SIMS). The metal used was silver, an
Autor:
N. S. McIntyre, J. T. Francis
Publikováno v:
Surface and Interface Analysis. 37:743-748
This work documents the behaviour of the positive secondary ion yield of bulk polytetrafluoroethylene (PTFE) under dual-beam depth profiling conditions employing 1 keV Ar+, Cs+ and SF5+. A unique chemical interaction is observed in the form of a dram
Publikováno v:
Surface and Interface Analysis. 31:1079-1084
The properties of the interphase between Twaron® aramid fibres and polymer matrix systems can be optimized by a surface treatment process of the fibres. In this work, x-ray photoelectron spectroscopy and low-energy ion scattering have been used to a
Autor:
Mineharu Suzuki, Gregory L. Fisher, Shin-ichi Iida, Takuya Miyayama, Scott R. Bryan, Noriaki Sanada
Publikováno v:
Surface and Interface Analysis. 43:214-216
The introduction of C 60 + as a sputter ion beam for ToF-SIMS has made it possible to acquire molecular depth profiles on a wide varietyof polymers. However, previous studies have indicated that certain classes of polymers undergo sputter-induced dam