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Autor:
Aneesh Prabhakaran, Sami Yunus, Nimer Wehbe, Karim Hamraoui, Patrick Bertrand, Arnaud Delcorte, Oscar A. Restrepo
Publikováno v:
Surface and Interface Analysis
This article compares the experimental results obtained in metal-assisted secondary ion mass spectrometry of polymers, with molecular dynamics simulations involving hybrid metal-organic surfaces. The theoretical sputtering yields are in agreement wit
Publikováno v:
Surface and Interface Analysis. 40:1067-1070
The geometrical structures and electronic properties of P66 fullerene-polymer sheets areinvestigated using semiempirical tight-binding calculations and first-principles calculationsbased on the density functional theory. Our results indicate that the
Autor:
Mineharu Suzuki, Gregory L. Fisher, Shin-ichi Iida, Takuya Miyayama, Scott R. Bryan, Noriaki Sanada
Publikováno v:
Surface and Interface Analysis. 43:214-216
The introduction of C 60 + as a sputter ion beam for ToF-SIMS has made it possible to acquire molecular depth profiles on a wide varietyof polymers. However, previous studies have indicated that certain classes of polymers undergo sputter-induced dam