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Autor:
Iyer, Ravi, Zhao, Li, Guo, Fei, Illikkal, Ramesh, Makineni, Srihari, Newell, Don, Solihin, Yan, Hsu, Lisa, Reinhardt, Steve
Publikováno v:
Proceedings of the 2007 ACM SIGMETRICS International Conference: Measurement & Modeling of Computer Systems; 6/12/2007, p25-36, 12p