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Publikováno v:
Physica Status Solidi (a). 136:131-138
Fixed-wavelength ellipsometry at two wavelengths, λ = 632.8 and 785 nm, is used for the determination of thickness and composition of thin epitaxial Si1−xGex films on silicon substrates. The results are compared to those obtained by X-ray double c
Autor:
Ekaterina Yantcevich, Hanna Bandarenka, Nelya V. Doroshkevich, Kseniya Girel, Grigory Arzumanyan
Publikováno v:
physica status solidi (a). 213:2911-2915
Here we report the SERS spectroscopy study of the herring sperm DNA adsorbed on the silvered porous silicon. Porous silicon has been fabricated by an electrochemical anodic etching of a highly doped n-type silicon wafer. It has been shown that the fo