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Autor:
Hongwei Liu, Tianqi Dou, Shunyu Yang, Guo-Xing Miao, Wenxiu Qu, Zhongqi Sun, Yuqing Huang, Yanxin Han, Haiqiang Ma, Jipeng Wang, Fen Zhou, Zhenhua Li
Publikováno v:
Optics Letters. 45:6334
The source flaw associated with the basis vector in the reference-frame-independent measurement-device-independent quantum key distribution (RFI-MDI-QKD) has not been systematically studied. As a result, it is often assumed that bit error is equal to